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Carrier escape from ground state and non-zero resonance frequency at low bias powers for semiconductor quantum-dot lasers

  • Université Européenne de Bretagne
  • CNRS LTCI

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

2 Citations (Scopus)

Résumé

The three-dimensional confinement of electrons and holes in the semiconductor quantum dot (QD) structure profoundly changes its density of states compared to the bulk semiconductor or the thin-film quantum well (QW) structure. The aim of this paper is to theoretically investigate the microwave properties of InAs/InP(311B) QD lasers. A new expression of the modulation transfer function is derived for the analysis of QD laser modulation properties based on a set of four rate equations. Analytical calculations point out that carrier escape from ground state (GS) to excited state (ES) induces a non-zero resonance frequency at low bias powers. Calculations also show that the carrier escape leads to a larger damping factor offset as compared to conventional QW lasers. These results are of prime importance for a better understanding of the carrier dynamics in QD lasers as well as for further optimization of low cost sources for optical telecommunications.

langue originaleAnglais
titreSemiconductor Lasers and Laser Dynamics V
Les DOIs
étatPublié - 20 juin 2012
Modification externeOui
EvénementSemiconductor Lasers and Laser Dynamics V - Brussels, Belgique
Durée: 16 avr. 2012 → 19 avr. 2012

Série de publications

NomProceedings of SPIE - The International Society for Optical Engineering
Volume8432
ISSN (imprimé)0277-786X

Une conférence

Une conférenceSemiconductor Lasers and Laser Dynamics V
Pays/TerritoireBelgique
La villeBrussels
période16/04/12 → 19/04/12

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