Résumé
We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an X-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparaison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 23-34 |
| Nombre de pages | 12 |
| journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4505 |
| Les DOIs | |
| état | Publié - 1 janv. 2001 |
| Modification externe | Oui |
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