Résumé
We present a new Cu(In,Ga)Se2 characterization tool: Cu(In,Ga)Se2 microcells. By creating pixels on a Cu(In,Ga)Se 2 substrate, we are able to test electrically different locations. Moreover, because of the reduced size of the cells, (5-to 500-μm wide), heat and spreading resistance losses are made negligible, which make high flux characterizations available. We analyze current-voltage curves under high concentration to gain insight in the physical properties of Cu(In,Ga)Se 2 cells. From our analysis, Cu(In,Ga)Se 2 electrodeposited absorbers present resistivity fluctuations that are much more important than co-evaporated ones. These absorbers, as they present more electronic defects, are also more affected by the Voc increase under intense fluxes, and the efficiency gains can be very significant: up to 6% absolute efficiency points at less than 50 suns.
| langue originale | Anglais |
|---|---|
| Numéro d'article | 6695773 |
| Pages (de - à) | 693-696 |
| Nombre de pages | 4 |
| journal | IEEE Journal of Photovoltaics |
| Volume | 4 |
| Numéro de publication | 2 |
| Les DOIs | |
| état | Publié - 1 mars 2014 |
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