TY - GEN
T1 - Characterization of the "guided light/photonic crystal" coupling by absorbance
AU - Devys, Lucie
AU - Dantelle, Géraldine
AU - Kubytskyi, Viacheslav
AU - Benisty, Henri
AU - Gacoin, Thierry
PY - 2013/12/1
Y1 - 2013/12/1
N2 - Considering luminescent TiO2 films whose surface was imprinted with a 2D square shaped photonic crystal with different pattern depths (from 20 to 61 nm), we demonstrate the possibility to use simple absorption measurements to evaluate the efficiency of light extraction. Absorption spectra of the patterned systems show absorption peaks, evidencing the coupling between the photonic crystal structure and light guided within the film, in good agreement with 2D-RCWA simulations. The deeper the pattern depth, the stronger the coupling between the guided light and the photonic crystal. Using RCWA simulations, we show that it is possible to evaluate the extraction length, characteristic of the efficiency of light extraction, from the absorption spectra, in good agreement with direct measurements reported elsewhere.
AB - Considering luminescent TiO2 films whose surface was imprinted with a 2D square shaped photonic crystal with different pattern depths (from 20 to 61 nm), we demonstrate the possibility to use simple absorption measurements to evaluate the efficiency of light extraction. Absorption spectra of the patterned systems show absorption peaks, evidencing the coupling between the photonic crystal structure and light guided within the film, in good agreement with 2D-RCWA simulations. The deeper the pattern depth, the stronger the coupling between the guided light and the photonic crystal. Using RCWA simulations, we show that it is possible to evaluate the extraction length, characteristic of the efficiency of light extraction, from the absorption spectra, in good agreement with direct measurements reported elsewhere.
KW - Extraction length
KW - Paterning
KW - Photonic crystal
KW - RCWA simulation
UR - https://www.scopus.com/pages/publications/84896805853
U2 - 10.1117/12.2024063
DO - 10.1117/12.2024063
M3 - Conference contribution
AN - SCOPUS:84896805853
SN - 9780819496683
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Nanostructured Thin Films VI
T2 - Nanostructured Thin Films VI
Y2 - 28 August 2013 through 29 August 2013
ER -