Cherenkov light-based beam profiling for ultrarelativistic electron beams

E. Adli; S. J. Gessner; S. Corde; M. J. Hogan; H. H. Bjerke

doi:10.1016/j.nima.2015.02.003

Cherenkov light-based beam profiling for ultrarelativistic electron beams

E. Adli
, S. J. Gessner
, S. Corde
, M. J. Hogan
, H. H. Bjerke

University of Oslo
Stanford Linear Accelerator Center
Norwegian University of Science and Technology

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.

langue originale	Anglais
Numéro d'article	57505
Pages (de - à)	35-42
Nombre de pages	8
journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	783
Les DOIs	https://doi.org/10.1016/j.nima.2015.02.003
état	Publié - 1 janv. 2015
Modification externe	Oui

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10.1016/j.nima.2015.02.003

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title = "Cherenkov light-based beam profiling for ultrarelativistic electron beams",

abstract = "Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.",

keywords = "Cherenkov light, Electron beams, FACET User Facility, Profile monitor",

author = "E. Adli and Gessner, \{S. J.\} and S. Corde and Hogan, \{M. J.\} and Bjerke, \{H. H.\}",

year = "2015",

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doi = "10.1016/j.nima.2015.02.003",

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Cherenkov light-based beam profiling for ultrarelativistic electron beams. / Adli, E.; Gessner, S. J.; Corde, S. et al.
Dans: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol 783, 57505, 01.01.2015, p. 35-42.

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

TY - JOUR

T1 - Cherenkov light-based beam profiling for ultrarelativistic electron beams

AU - Adli, E.

AU - Gessner, S. J.

AU - Corde, S.

AU - Hogan, M. J.

AU - Bjerke, H. H.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.

AB - Abstract We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. The profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. We report on the measured performance of this profile monitor.

KW - Cherenkov light

KW - Electron beams

KW - FACET User Facility

KW - Profile monitor

UR - https://www.scopus.com/pages/publications/84924272647

U2 - 10.1016/j.nima.2015.02.003

DO - 10.1016/j.nima.2015.02.003

M3 - Article

AN - SCOPUS:84924272647

SN - 0168-9002

VL - 783

SP - 35

EP - 42

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

M1 - 57505

ER -

Cherenkov light-based beam profiling for ultrarelativistic electron beams

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