Résumé
Well-ordered clean InAs(1 1 1) A and B surfaces have been prepared using HCl-isopropanol solutions and characterized using low-energy electron diffraction and photoemission spectroscopy. The as-treated surfaces are covered by a layer containing arsenic and small amounts of InClx. Annealing induces desorption of the overlayer and reveals (2 × 2) and (1 × 1) structures on the A and B surfaces, respectively. For both surfaces, the surface components of the In 4d and As 3d reveal a charge transfer from the electropositive surface indium to the electronegative surface arsenic. The major advantage of this preparation method over conventional thermal cleaning is a significant reduction in the annealing temperature (≈250 °C) thereby avoiding anion evaporation.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 518-522 |
| Nombre de pages | 5 |
| journal | Surface Science |
| Volume | 603 |
| Numéro de publication | 3 |
| Les DOIs | |
| état | Publié - 1 févr. 2009 |
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