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Coherence Measurements of a Transient 14.7 nm X-ray Laser

  • J. Dunn
  • , R. F. Smith
  • , S. Hubert
  • , M. Fajardo
  • , P. Zeitoun
  • , J. R. Hunter
  • , C. Remond
  • , L. Vanbostal
  • , S. Jacquemot
  • , J. Nilsen
  • , C. L.S. Lewis
  • , R. Marmoret
  • , V. N. Shlyaptsev
  • , M. F. Ravet
  • , F. Delmotte
  • Lawrence Livermore National Laboratory
  • Centre d'Etudes de Limeil-Valenton
  • Université Paris-Saclay
  • Queen's University of Belfast
  • University of California, Davis
  • Laboratoire Charles Fabry

Résultats de recherche: Contribution à un journalArticle de conférenceRevue par des pairs

2 Citations (Scopus)

Résumé

We present the longitudinal coherence measurement of the transient inversion collisional x-ray laser for the first time. The Ni-like Pd x-ray laser at 14.68 nm is generated by the LLNL COMET laser facility and is operating in the gain-saturated regime. Interference fringes are produced using a Michelson interferometer setup in which a thin multilayer-coated membrane is used as a beam splitter. The longitudinal coherence length for the picosecond duration 4d1S0 → 4p1P1 lasing transition is determined to be ∼400 μm (1/e HW) by adjusting the length of one interferometer arm and measuring the resultant variation in fringe visibility. This is four times improved coherence than previous measurements on quasi-steady state schemes largely as a result of the narrower line profile in the lower temperature plasma. The inferred gain-narrowed linewidth of ∼0.29 pm is also substantially narrower than previous measurements on quasi-steady state x-ray laser schemes. This study shows that the coherence of the x-ray laser beam can be improved by changing the laser pumping conditions. The x-ray laser is operating at 4 - 5 times the transform-limited pulse.

langue originaleAnglais
Pages (de - à)43-50
Nombre de pages8
journalProceedings of SPIE - The International Society for Optical Engineering
Volume5197
Les DOIs
étatPublié - 1 janv. 2003
Modification externeOui
EvénementSoft X-Ray Lasers and Applications V - San Diego, CA, États-Unis
Durée: 6 août 20037 août 2003

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