TY - GEN
T1 - COOkeD
T2 - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
AU - Humblot-Renaux, Galadrielle
AU - Franchi, Gianni
AU - Escalera, Sergio
AU - Moeslund, Thomas B.
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025/1/1
Y1 - 2025/1/1
N2 - Out-of-distribution (OOD) detection is an important building block in trustworthy image recognition systems as unknown classes may arise at test-time. OOD detection methods typically revolve around a single classifier, leading to a split in the research field between the classical supervised setting (e.g. ResNet18 classifier trained on CIFAR100) vs. the zero-shot setting (class names fed as prompts to CLIP). In both cases, an overarching challenge is that the OOD detection performance is implicitly constrained by the classifier's capabilities on in-distribution (ID) data. In this work, we show that given a little open-mindedness from both ends, remarkable OOD detection can be achieved by instead creating a heterogeneous ensemble - COOkeD combines the predictions of a closed-world classifier trained end-to-end on a specific dataset, a zero-shot CLIP classifier, and a linear probe classifier trained on CLIP image features. While bulky at first sight, this approach is modular, post-hoc and leverages the availability of pre-trained VLMs, thus introduces little overhead compared to training a single standard classifier. We evaluate COOkeD on popular CIFAR100 and ImageNet benchmarks, but also consider more challenging, realistic settings ranging from training-time label noise, to test-time covariate shift, to zero-shot shift which has been previously overlooked. Despite its simplicity, COOkeD achieves state-of-the-art performance and greater robustness compared to both classical and CLIP-based OOD detection methods. Code is available at https://github.com/glhr/COOkeD
AB - Out-of-distribution (OOD) detection is an important building block in trustworthy image recognition systems as unknown classes may arise at test-time. OOD detection methods typically revolve around a single classifier, leading to a split in the research field between the classical supervised setting (e.g. ResNet18 classifier trained on CIFAR100) vs. the zero-shot setting (class names fed as prompts to CLIP). In both cases, an overarching challenge is that the OOD detection performance is implicitly constrained by the classifier's capabilities on in-distribution (ID) data. In this work, we show that given a little open-mindedness from both ends, remarkable OOD detection can be achieved by instead creating a heterogeneous ensemble - COOkeD combines the predictions of a closed-world classifier trained end-to-end on a specific dataset, a zero-shot CLIP classifier, and a linear probe classifier trained on CLIP image features. While bulky at first sight, this approach is modular, post-hoc and leverages the availability of pre-trained VLMs, thus introduces little overhead compared to training a single standard classifier. We evaluate COOkeD on popular CIFAR100 and ImageNet benchmarks, but also consider more challenging, realistic settings ranging from training-time label noise, to test-time covariate shift, to zero-shot shift which has been previously overlooked. Despite its simplicity, COOkeD achieves state-of-the-art performance and greater robustness compared to both classical and CLIP-based OOD detection methods. Code is available at https://github.com/glhr/COOkeD
KW - clip
KW - covariate shift
KW - deep learning
KW - distribution shift
KW - ensembles
KW - ensembling
KW - image classification
KW - label noise
KW - ood detection
KW - out-of-distribution detection
KW - robustness
KW - vision-language models
KW - zero-shot classification
UR - https://www.scopus.com/pages/publications/105035170122
U2 - 10.1109/ICCVW69036.2025.00033
DO - 10.1109/ICCVW69036.2025.00033
M3 - Conference contribution
AN - SCOPUS:105035170122
T3 - Proceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
SP - 261
EP - 271
BT - Proceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 19 October 2025 through 20 October 2025
ER -