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COOkeD: Ensemble-Based OOD Detection in the Era of Zero-Shot CLIP

  • Galadrielle Humblot-Renaux
  • , Gianni Franchi
  • , Sergio Escalera
  • , Thomas B. Moeslund
  • Aalborg University
  • University of Barcelona

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Résumé

Out-of-distribution (OOD) detection is an important building block in trustworthy image recognition systems as unknown classes may arise at test-time. OOD detection methods typically revolve around a single classifier, leading to a split in the research field between the classical supervised setting (e.g. ResNet18 classifier trained on CIFAR100) vs. the zero-shot setting (class names fed as prompts to CLIP). In both cases, an overarching challenge is that the OOD detection performance is implicitly constrained by the classifier's capabilities on in-distribution (ID) data. In this work, we show that given a little open-mindedness from both ends, remarkable OOD detection can be achieved by instead creating a heterogeneous ensemble - COOkeD combines the predictions of a closed-world classifier trained end-to-end on a specific dataset, a zero-shot CLIP classifier, and a linear probe classifier trained on CLIP image features. While bulky at first sight, this approach is modular, post-hoc and leverages the availability of pre-trained VLMs, thus introduces little overhead compared to training a single standard classifier. We evaluate COOkeD on popular CIFAR100 and ImageNet benchmarks, but also consider more challenging, realistic settings ranging from training-time label noise, to test-time covariate shift, to zero-shot shift which has been previously overlooked. Despite its simplicity, COOkeD achieves state-of-the-art performance and greater robustness compared to both classical and CLIP-based OOD detection methods. Code is available at https://github.com/glhr/COOkeD

langue originaleAnglais
titreProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages261-271
Nombre de pages11
ISBN (Electronique)9798331589882
Les DOIs
étatPublié - 1 janv. 2025
Evénement2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 - Honolulu, États-Unis
Durée: 19 oct. 202520 oct. 2025

Série de publications

NomProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025

Une conférence

Une conférence2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
Pays/TerritoireÉtats-Unis
La villeHonolulu
période19/10/2520/10/25

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