Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067)

Galyna Sych; Patrice Rannou; Maxime Jullien-Palletier; Saïd Sadki; Yvan Bonnassieux; Sébastien Sanaur

doi:10.1002/aelm.202300788

Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067)

Galyna Sych
, Patrice Rannou
, Maxime Jullien-Palletier
, Saïd Sadki
, Yvan Bonnassieux
, Sébastien Sanaur

Résultats de recherche: Contribution à un journal › Commentaire/débat

Résumé

Adv. Electronic Mater. 2023, 9, 2201067 DOI: 10.1002/aelm.202201067 In the abstract of the originally published manuscript, the sentence “Normalized contact resistances (RS/D⋅W) values as low as 1.4 W cm are obtained.” is incorrect. The correct sentence is: “Normalized contact resistances (RS/D⋅W) values as low as 1.4 Ohm.cm are obtained.” This error does not alter the conclusions of the report. The authors apologize for any inconvenience caused.

langue originale	Anglais
Numéro d'article	2300788
journal	Advanced Electronic Materials
Volume	10
Numéro de publication	2
Les DOIs	https://doi.org/10.1002/aelm.202300788
état	Publié - 1 févr. 2024

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10.1002/aelm.202300788

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Contient cette citation

Sych, G., Rannou, P., Jullien-Palletier, M., Sadki, S., Bonnassieux, Y., & Sanaur, S. (2024). Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067). Advanced Electronic Materials, 10(2), Article 2300788. https://doi.org/10.1002/aelm.202300788

@article{3eead7fb6c734d53964d2d7246fc1714,

title = "Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067)",

abstract = "Adv. Electronic Mater. 2023, 9, 2201067 DOI: 10.1002/aelm.202201067 In the abstract of the originally published manuscript, the sentence “Normalized contact resistances (RS/D⋅W) values as low as 1.4 W cm are obtained.” is incorrect. The correct sentence is: “Normalized contact resistances (RS/D⋅W) values as low as 1.4 Ohm.cm are obtained.” This error does not alter the conclusions of the report. The authors apologize for any inconvenience caused.",

author = "Galyna Sych and Patrice Rannou and Maxime Jullien-Palletier and Sa{\"i}d Sadki and Yvan Bonnassieux and S{\'e}bastien Sanaur",

note = "Publisher Copyright: {\textcopyright} 2024 The Authors. Advanced Electronic Materials published by Wiley-VCH GmbH.",

year = "2024",

month = feb,

day = "1",

doi = "10.1002/aelm.202300788",

language = "English",

volume = "10",

journal = "Advanced Electronic Materials",

issn = "2199-160X",

number = "2",

}

Sych, G, Rannou, P, Jullien-Palletier, M, Sadki, S, Bonnassieux, Y & Sanaur, S 2024, 'Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067)', Advanced Electronic Materials, VOL. 10, Numéro 2, 2300788. https://doi.org/10.1002/aelm.202300788

Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067). / Sych, Galyna; Rannou, Patrice; Jullien-Palletier, Maxime et al.
Dans: Advanced Electronic Materials, Vol 10, Numéro 2, 2300788, 01.02.2024.

Résultats de recherche: Contribution à un journal › Commentaire/débat

TY - JOUR

T1 - Correction to:Impact of Charge Carrier Injection/Extraction Performances in Low-Dimension PEDOT:PSS Organic Electrochemical Transistors(Adv. Electronic Mater., (2023), 9, (2201067), 10.1002/aelm.202201067)

AU - Sych, Galyna

AU - Rannou, Patrice

AU - Jullien-Palletier, Maxime

AU - Sadki, Saïd

AU - Bonnassieux, Yvan

AU - Sanaur, Sébastien

PY - 2024/2/1

Y1 - 2024/2/1

N2 - Adv. Electronic Mater. 2023, 9, 2201067 DOI: 10.1002/aelm.202201067 In the abstract of the originally published manuscript, the sentence “Normalized contact resistances (RS/D⋅W) values as low as 1.4 W cm are obtained.” is incorrect. The correct sentence is: “Normalized contact resistances (RS/D⋅W) values as low as 1.4 Ohm.cm are obtained.” This error does not alter the conclusions of the report. The authors apologize for any inconvenience caused.

AB - Adv. Electronic Mater. 2023, 9, 2201067 DOI: 10.1002/aelm.202201067 In the abstract of the originally published manuscript, the sentence “Normalized contact resistances (RS/D⋅W) values as low as 1.4 W cm are obtained.” is incorrect. The correct sentence is: “Normalized contact resistances (RS/D⋅W) values as low as 1.4 Ohm.cm are obtained.” This error does not alter the conclusions of the report. The authors apologize for any inconvenience caused.

U2 - 10.1002/aelm.202300788

DO - 10.1002/aelm.202300788

M3 - Comment/debate

AN - SCOPUS:85178124027

SN - 2199-160X

VL - 10

JO - Advanced Electronic Materials

JF - Advanced Electronic Materials

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M1 - 2300788

ER -