Cross logic: A new approach for defect-tolerant circuits

Mariem Slimani; Arwa Ben Dhia; Lirida Naviner

doi:10.1109/ICICDT.2014.6838602

Cross logic: A new approach for defect-tolerant circuits

Mariem Slimani
, Arwa Ben Dhia
, Lirida Naviner

CNRS LTCI

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

Résumé

As technology scales down to the nanometer era, manufacturing defects are rapidly becoming a major concern in the design of electronic circuits. In this work, we present a defect-tolerant logic family constructed with CMOS cells. The basic idea of this approach is the construction of logic gates in which the outputs and their complementaries correct each other. We demonstrate, through circuit simulation using CMOS cells from a 65nm industrial process, that the proposed logic turns out to be a good compromise to construct robust circuits under the constraint of limited area overhead.

langue originale	Anglais
titre	ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology
Editeur	IEEE Computer Society
ISBN (imprimé)	9781479921539
Les DOIs	https://doi.org/10.1109/ICICDT.2014.6838602
état	Publié - 1 janv. 2014
Modification externe	Oui
Evénement	2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014 - Austin, TX, États-Unis Durée: 28 mai 2014 → 30 mai 2014

Série de publications

Nom	ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology

Une conférence

Une conférence	2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014
Pays/Territoire	États-Unis
La ville	Austin, TX
période	28/05/14 → 30/05/14

Accès au document

10.1109/ICICDT.2014.6838602

Contient cette citation

Slimani, M., Ben Dhia, A., & Naviner, L. (2014). Cross logic: A new approach for defect-tolerant circuits. Dans ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology Article 6838602 (ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology). IEEE Computer Society. https://doi.org/10.1109/ICICDT.2014.6838602

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title = "Cross logic: A new approach for defect-tolerant circuits",

abstract = "As technology scales down to the nanometer era, manufacturing defects are rapidly becoming a major concern in the design of electronic circuits. In this work, we present a defect-tolerant logic family constructed with CMOS cells. The basic idea of this approach is the construction of logic gates in which the outputs and their complementaries correct each other. We demonstrate, through circuit simulation using CMOS cells from a 65nm industrial process, that the proposed logic turns out to be a good compromise to construct robust circuits under the constraint of limited area overhead.",

keywords = "Robustness, analog fault simulation, defect modeling, defect tolerance",

author = "Mariem Slimani and \{Ben Dhia\}, Arwa and Lirida Naviner",

year = "2014",

month = jan,

day = "1",

doi = "10.1109/ICICDT.2014.6838602",

language = "English",

isbn = "9781479921539",

series = "ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology",

publisher = "IEEE Computer Society",

booktitle = "ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology",

note = "2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014 ; Conference date: 28-05-2014 Through 30-05-2014",

}

Slimani, M, Ben Dhia, A & Naviner, L 2014, Cross logic: A new approach for defect-tolerant circuits. Dans ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology., 6838602, ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology, IEEE Computer Society, 2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014, Austin, TX, États-Unis, 28/05/14. https://doi.org/10.1109/ICICDT.2014.6838602

Cross logic: A new approach for defect-tolerant circuits. / Slimani, Mariem; Ben Dhia, Arwa; Naviner, Lirida.
ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology. IEEE Computer Society, 2014. 6838602 (ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology).

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

TY - GEN

T1 - Cross logic

T2 - 2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014

AU - Slimani, Mariem

AU - Ben Dhia, Arwa

AU - Naviner, Lirida

PY - 2014/1/1

Y1 - 2014/1/1

N2 - As technology scales down to the nanometer era, manufacturing defects are rapidly becoming a major concern in the design of electronic circuits. In this work, we present a defect-tolerant logic family constructed with CMOS cells. The basic idea of this approach is the construction of logic gates in which the outputs and their complementaries correct each other. We demonstrate, through circuit simulation using CMOS cells from a 65nm industrial process, that the proposed logic turns out to be a good compromise to construct robust circuits under the constraint of limited area overhead.

AB - As technology scales down to the nanometer era, manufacturing defects are rapidly becoming a major concern in the design of electronic circuits. In this work, we present a defect-tolerant logic family constructed with CMOS cells. The basic idea of this approach is the construction of logic gates in which the outputs and their complementaries correct each other. We demonstrate, through circuit simulation using CMOS cells from a 65nm industrial process, that the proposed logic turns out to be a good compromise to construct robust circuits under the constraint of limited area overhead.

KW - Robustness

KW - analog fault simulation

KW - defect modeling

KW - defect tolerance

U2 - 10.1109/ICICDT.2014.6838602

DO - 10.1109/ICICDT.2014.6838602

M3 - Conference contribution

AN - SCOPUS:84904197188

SN - 9781479921539

T3 - ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology

BT - ICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology

PB - IEEE Computer Society

Y2 - 28 May 2014 through 30 May 2014

ER -

Cross logic: A new approach for defect-tolerant circuits

Résumé

Série de publications

Une conférence

Accès au document

Empreinte digitale

Contient cette citation