Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry

E. V.K. Rao; Y. Gottesman

Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry

E. V.K. Rao
, Y. Gottesman

CNRS

Résultats de recherche: Contribution à un journal › Article de conférence › Revue par des pairs

Résumé

This talk describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).

langue originale	Anglais
Pages (de - à)	544-545
Nombre de pages	2
journal	Conference Proceedings-International Conference on Indium Phosphide and Related Materials
état	Publié - 25 juil. 2003
Evénement	2003 International Conference Indium Phosphide and Related Materials - Santa Barbara, CA, États-Unis Durée: 12 mai 2003 → 16 mai 2003

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title = "Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry",

abstract = "This talk describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).",

author = "Rao, \{E. V.K.\} and Y. Gottesman",

year = "2003",

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language = "English",

pages = "544--545",

journal = "Conference Proceedings-International Conference on Indium Phosphide and Related Materials",

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T1 - Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry

AU - Rao, E. V.K.

AU - Gottesman, Y.

PY - 2003/7/25

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N2 - This talk describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).

AB - This talk describes the high potential of optical low-coherence reflectometry (OLCR) and its upgraded in-situ facilities to assess the fabrication techniques of InP-based photonic circuits and also to help to optimize the design and further evaluate the performance of several key components (butt-joints, bend guides, MMI couplers, EAMs, DBR lasers, etc.,).

UR - https://www.scopus.com/pages/publications/0038825086

M3 - Conference article

AN - SCOPUS:0038825086

SN - 1092-8669

SP - 544

EP - 545

JO - Conference Proceedings-International Conference on Indium Phosphide and Related Materials

JF - Conference Proceedings-International Conference on Indium Phosphide and Related Materials

T2 - 2003 International Conference Indium Phosphide and Related Materials

Y2 - 12 May 2003 through 16 May 2003

ER -

Design, process and performance diagnosis of InP-based photonic components using low-coherence reflectometry

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