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Dispersive processes of light-induced defect creation in hydrogenated amorphous silicon

  • Hiroshima Institute of Technology
  • Electro-Chemical and Cancer Institute
  • Meikai University

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

The growing curve of light-induced dangling bonds under illumination has been observed for various intensities of illumination in a-Si:H. It is fitted to a stretched exponential function and then two parameters β and τ involved in the function are estimated as a function of saturated dangling bond density Nss. The experimental values of β, τ, and Nss are compared with those calculated based on our model of light-induced defect creation in a-Si:H.

langue originaleAnglais
Pages (de - à)232-236
Nombre de pages5
journalSolid State Communications
Volume142
Numéro de publication4
Les DOIs
étatPublié - 1 avr. 2007

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