Résumé
The growing curve of light-induced dangling bonds under illumination has been observed for various intensities of illumination in a-Si:H. It is fitted to a stretched exponential function and then two parameters β and τ involved in the function are estimated as a function of saturated dangling bond density Nss. The experimental values of β, τ, and Nss are compared with those calculated based on our model of light-induced defect creation in a-Si:H.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 232-236 |
| Nombre de pages | 5 |
| journal | Solid State Communications |
| Volume | 142 |
| Numéro de publication | 4 |
| Les DOIs | |
| état | Publié - 1 avr. 2007 |
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