Résumé
In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion, we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 μm in cementitious materials is groundless.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 92-99 |
| Nombre de pages | 8 |
| journal | Cement and Concrete Composites |
| Volume | 32 |
| Numéro de publication | 1 |
| Les DOIs |
|
| état | Publié - 1 janv. 2010 |
| Modification externe | Oui |
Empreinte digitale
Examiner les sujets de recherche de « Does microstructure matter for statistical nanoindentation techniques? ». Ensemble, ils forment une empreinte digitale unique.Contient cette citation
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver