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Dynamic and transient analysis of silicon-based thin-film transistors: Channel propagation model

  • Jong W. Jin
  • , Jean Charles Vanel
  • , Dmitri Daineka
  • , Tayeb Mohammed-Brahim
  • , Yvan Bonnassieux
  • Institut polytechnique de Paris
  • Bâtiment 11D

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

7 Citations (Scopus)

Résumé

The quasi-static approach in the dynamic modeling considers that a thin-film transistor (TFT) reaches the steady-state instantaneously, and how to insert its behavior before steady-state is an important issue. In this paper, dynamic responses of silicon-based TFTs under gate-voltage pulse are studied in details. We experimentally distinguish quasi-static and non-quasi-static cases and we identify two charging regimes of the channel formation: channel propagation and charging of the fully propagated channel. We propose a model for the channel propagation, with a compact model-like approach to take into account the effect of defect states.

langue originaleAnglais
Numéro d'article6479318
Pages (de - à)871-876
Nombre de pages6
journalIEEE/OSA Journal of Display Technology
Volume9
Numéro de publication11
Les DOIs
étatPublié - 19 mars 2013

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