Résumé
The quasi-static approach in the dynamic modeling considers that a thin-film transistor (TFT) reaches the steady-state instantaneously, and how to insert its behavior before steady-state is an important issue. In this paper, dynamic responses of silicon-based TFTs under gate-voltage pulse are studied in details. We experimentally distinguish quasi-static and non-quasi-static cases and we identify two charging regimes of the channel formation: channel propagation and charging of the fully propagated channel. We propose a model for the channel propagation, with a compact model-like approach to take into account the effect of defect states.
| langue originale | Anglais |
|---|---|
| Numéro d'article | 6479318 |
| Pages (de - à) | 871-876 |
| Nombre de pages | 6 |
| journal | IEEE/OSA Journal of Display Technology |
| Volume | 9 |
| Numéro de publication | 11 |
| Les DOIs | |
| état | Publié - 19 mars 2013 |
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