Résumé
We study the effect of Gaussian energetic disorder on the organic field-effect transistors (OFETs) with surprisingly high field-effect mobility and the low contact resistance. The numerical device simulation assumes the thermally assisted hopping transport and injection in disordered semiconductors. The results are analyzed with the power-law field-effect mobility and the asymptotic power-law contact resistance model. Transistor parameters extracted by the models reveal that a higher Gaussian disorder, which leads to a lower injection barrier and a larger mobility enhancement, is the origin of the high field-effect mobility and the low contact resistance.
| langue originale | Anglais |
|---|---|
| Numéro d'article | 9258937 |
| Pages (de - à) | 307-310 |
| Nombre de pages | 4 |
| journal | IEEE Transactions on Electron Devices |
| Volume | 68 |
| Numéro de publication | 1 |
| Les DOIs | |
| état | Publié - 1 janv. 2021 |
| Modification externe | Oui |
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