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Efficient computation of combinational circuits reliability based on probabilistic transfer matrix

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Résumé

The rapid dimension scaling of CMOS has introduced many new challenges. One of them is to design reliable circuits with unreliable devices. Probabilistic transfer matrix (PTM) has proven to be an accurate method to evaluate the reliability of a combinational circuit. However, it requires a lot of time consumption and memory usage, which makes it unsuitable for large circuits. In this paper, we propose optimizations on PTM calculation that allow to obtain accurate reliability while reducing computational and memory needs. Some benchmark circuits have been tested to verify the efficiency of the proposed method by comparing its time consumption and memory usage with the traditional PTM implementation.

langue originaleAnglais
titreICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology
EditeurIEEE Computer Society
ISBN (imprimé)9781479921539
Les DOIs
étatPublié - 1 janv. 2014
Modification externeOui
Evénement2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014 - Austin, TX, États-Unis
Durée: 28 mai 201430 mai 2014

Série de publications

NomICICDT 2014 - IEEE International Conference on Integrated Circuit Design and Technology

Une conférence

Une conférence2014 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2014
Pays/TerritoireÉtats-Unis
La villeAustin, TX
période28/05/1430/05/14

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