TY - GEN
T1 - Electric probes for fault injection attack
AU - Sauvage, Laurent
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2015/12/17
Y1 - 2015/12/17
N2 - Extracting secret information from an integrated circuit by disturbing it with an electromagnetic (EM) pulse has a growing interest. The success of such a process depends directly on the EM probes used. In this paper, we present the results of the experimental characterization of three electric probes, through their bandwidth and opening width. Strangely, the probe specifically designed to inject high power EM fields turns out to be the least efficient. Another, handmade, transfers only very low power to its victim. The latter is very satisfactory, but only in a preferred direction.
AB - Extracting secret information from an integrated circuit by disturbing it with an electromagnetic (EM) pulse has a growing interest. The success of such a process depends directly on the EM probes used. In this paper, we present the results of the experimental characterization of three electric probes, through their bandwidth and opening width. Strangely, the probe specifically designed to inject high power EM fields turns out to be the least efficient. Another, handmade, transfers only very low power to its victim. The latter is very satisfactory, but only in a preferred direction.
UR - https://www.scopus.com/pages/publications/85002169909
U2 - 10.1109/APEMC.2013.7360655
DO - 10.1109/APEMC.2013.7360655
M3 - Conference contribution
AN - SCOPUS:85002169909
T3 - 2013 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2013
BT - 2013 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2013
Y2 - 20 May 2013 through 23 May 2013
ER -