Electron spectrometry at the μeV level and the electron affinities of Si and F

C. Blondel; C. Delsart; F. Goldfarb

doi:10.1088/0953-4075/34/9/101

Electron spectrometry at the μeV level and the electron affinities of Si and F

C. Blondel
, C. Delsart
, F. Goldfarb

CNRS

Résultats de recherche: Contribution à un journal › Lettre › Revue par des pairs

Résumé

Photodetachment microscopy of the negative ions Si^- and F^- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of ²⁸Si and ¹⁹F are 11207.252(18) and 27432.446(19) cm^-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.

langue originale	Anglais
Pages (de - à)	L281-L288
journal	Journal of Physics B: Atomic, Molecular and Optical Physics
Volume	34
Numéro de publication	9
Les DOIs	https://doi.org/10.1088/0953-4075/34/9/101
état	Publié - 14 mai 2001

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10.1088/0953-4075/34/9/101

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title = "Electron spectrometry at the μeV level and the electron affinities of Si and F",

abstract = "Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11207.252(18) and 27432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.",

author = "C. Blondel and C. Delsart and F. Goldfarb",

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T1 - Electron spectrometry at the μeV level and the electron affinities of Si and F

AU - Blondel, C.

AU - Delsart, C.

AU - Goldfarb, F.

PY - 2001/5/14

Y1 - 2001/5/14

N2 - Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11207.252(18) and 27432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.

AB - Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11207.252(18) and 27432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.

UR - https://www.scopus.com/pages/publications/0035858345

U2 - 10.1088/0953-4075/34/9/101

DO - 10.1088/0953-4075/34/9/101

M3 - Letter

AN - SCOPUS:0035858345

SN - 0953-4075

VL - 34

SP - L281-L288

JO - Journal of Physics B: Atomic, Molecular and Optical Physics

JF - Journal of Physics B: Atomic, Molecular and Optical Physics

IS - 9

ER -

Electron spectrometry at the μeV level and the electron affinities of Si and F

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