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Energetic electrons and x-ray photons from multiterawatt Ti: Sapphire lasers

  • P. V. Nickles
  • , M. P. Kalachnikov
  • , P. J. Warwick
  • , K. A. Janulewicz
  • , W. Sandner
  • , U. Jahnke
  • , D. Hilscher
  • , M. Schnürer
  • , R. Nolte
  • , A. Rousse
  • Max-Born-Institute
  • Helmholtz-Zentrum Berlin für Materialien und Energie GmbH
  • Vienna University of Technology
  • Physikalisch-Technische Bundesanstalt

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

The energy distribution and yield of electrons and hard x-ray photons were investigated by irradiating tungsten and tantalum targets with ∼30 fs pulses in the intensity range 1018-1019 W cm-2 by using the Laboratoire d'Optique Appliquée (LOA) as well as the Max Born Institut (MBI) multiterawatt Ti : sapphire lasers. For the measurement of the hard x-ray emission in the energy range from 15 keV to 700 keV at the LOA a 9-channel spectrometer of calibrated thermoluminescence detectors (TLD) was used. The scaling of the hard x-rays was studied by varying the incident laser energy within one order of magnitude and the pulsewidth by a factor of 5. The hot electron output was investigated in the range 300 keV-1 MeV with the new MBI Ti : sapphire laser by using a time-of-flight spectrometer. The results indicate a sensitive interplay between the temporal laser shape and laser intensity.

langue originaleAnglais
Pages (de - à)444-448
Nombre de pages5
journalQuantum Electronics
Volume29
Numéro de publication5
Les DOIs
étatPublié - 1 mai 1999

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