Résumé
The current process of growing graphene by thermal decomposition of 3C-SiC(100) on silicon is technologically attractive. Here, we study epitaxial graphene on single domain 3C-SiC films on off-axis Si(100). The structural and electronic properties of such graphene layers are explored by atomic force microscopy, x-ray photoelectron spectroscopy, and Raman spectroscopy. Using low energy electron diffraction, we show that graphene exhibits single planar domains. Near-edge x-ray absorption fine structure is used to characterize the sample, which confirms that the graphene layers present sp 2 hybridization and are homogeneously parallel to the substrate surface.
| langue originale | Anglais |
|---|---|
| Numéro d'article | 021603 |
| journal | Applied Physics Letters |
| Volume | 101 |
| Numéro de publication | 2 |
| Les DOIs | |
| état | Publié - 9 juil. 2012 |
| Modification externe | Oui |
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