Experimental comparison of 'load-pull' measurement systems for nonlinear power transistor characterization

G. Berghoff; F. Deshours; E. Bergeault; J. P. Villotte; B. Villeforceix

Experimental comparison of 'load-pull' measurement systems for nonlinear power transistor characterization

G. Berghoff
, F. Deshours
, E. Bergeault
, J. P. Villotte
, B. Villeforceix

Telecom Paris

Résultats de recherche: Contribution à un journal › Article de conférence › Revue par des pairs

Résumé

Load-Pull measurements are essential to characterize power devices accurately. This paper presents a comparison between two active and one passive Load-Pull measurement system. The experimental results obtained with a power MESFET transistor (1 Watt) are compared in terms of output power level and power added efficiency for various load impedances and input power levels.

langue originale	Anglais
Pages (de - à)	540-541
Nombre de pages	2
journal	CPEM Digest (Conference on Precision Electromagnetic Measurements)
état	Publié - 1 janv. 1996
Evénement	Proceedings of the 1996 Conference on Precision Electromagnetic Measurements - Braunschweig, Ger Durée: 17 juin 1996 → 20 juin 1996

Contient cette citation

@article{4919de1dff364fe6805a7548beabb3fa,

title = "Experimental comparison of 'load-pull' measurement systems for nonlinear power transistor characterization",

abstract = "Load-Pull measurements are essential to characterize power devices accurately. This paper presents a comparison between two active and one passive Load-Pull measurement system. The experimental results obtained with a power MESFET transistor (1 Watt) are compared in terms of output power level and power added efficiency for various load impedances and input power levels.",

author = "G. Berghoff and F. Deshours and E. Bergeault and Villotte, \{J. P.\} and B. Villeforceix",

year = "1996",

month = jan,

day = "1",

language = "English",

pages = "540--541",

journal = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",

issn = "0589-1485",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1996 Conference on Precision Electromagnetic Measurements ; Conference date: 17-06-1996 Through 20-06-1996",

}

TY - JOUR

T1 - Experimental comparison of 'load-pull' measurement systems for nonlinear power transistor characterization

AU - Berghoff, G.

AU - Deshours, F.

AU - Bergeault, E.

AU - Villotte, J. P.

AU - Villeforceix, B.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - Load-Pull measurements are essential to characterize power devices accurately. This paper presents a comparison between two active and one passive Load-Pull measurement system. The experimental results obtained with a power MESFET transistor (1 Watt) are compared in terms of output power level and power added efficiency for various load impedances and input power levels.

AB - Load-Pull measurements are essential to characterize power devices accurately. This paper presents a comparison between two active and one passive Load-Pull measurement system. The experimental results obtained with a power MESFET transistor (1 Watt) are compared in terms of output power level and power added efficiency for various load impedances and input power levels.

M3 - Conference article

AN - SCOPUS:0029765044

SN - 0589-1485

SP - 540

EP - 541

JO - CPEM Digest (Conference on Precision Electromagnetic Measurements)

JF - CPEM Digest (Conference on Precision Electromagnetic Measurements)

T2 - Proceedings of the 1996 Conference on Precision Electromagnetic Measurements

Y2 - 17 June 1996 through 20 June 1996

ER -

Experimental comparison of 'load-pull' measurement systems for nonlinear power transistor characterization

Résumé

Empreinte digitale

Contient cette citation