TY - GEN
T1 - Facial makeup detection technique based on texture and shape analysis
AU - Kose, Neslihan
AU - Apvrille, Ludovic
AU - Dugelay, Jean Luc
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/7/17
Y1 - 2015/7/17
N2 - Recent studies show that the performances of face recognition systems degrade in presence of makeup on face. In this paper, a facial makeup detector is proposed to further reduce the impact of makeup in face recognition. The performance of the proposed technique is tested using three publicly available facial makeup databases. The proposed technique extracts a feature vector that captures the shape and texture characteristics of the input face. After feature extraction, two types of classifiers (i.e. SVM and Alligator) are applied for comparison purposes. In this study, we observed that both classifiers provide significant makeup detection accuracy. There are only few studies regarding facial makeup detection in the state-of-the art. The proposed technique is novel and outperforms the state-of-the art significantly.
AB - Recent studies show that the performances of face recognition systems degrade in presence of makeup on face. In this paper, a facial makeup detector is proposed to further reduce the impact of makeup in face recognition. The performance of the proposed technique is tested using three publicly available facial makeup databases. The proposed technique extracts a feature vector that captures the shape and texture characteristics of the input face. After feature extraction, two types of classifiers (i.e. SVM and Alligator) are applied for comparison purposes. In this study, we observed that both classifiers provide significant makeup detection accuracy. There are only few studies regarding facial makeup detection in the state-of-the art. The proposed technique is novel and outperforms the state-of-the art significantly.
UR - https://www.scopus.com/pages/publications/84944930957
U2 - 10.1109/FG.2015.7163104
DO - 10.1109/FG.2015.7163104
M3 - Conference contribution
AN - SCOPUS:84944930957
T3 - 2015 11th IEEE International Conference and Workshops on Automatic Face and Gesture Recognition, FG 2015
BT - 2015 11th IEEE International Conference and Workshops on Automatic Face and Gesture Recognition, FG 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IEEE International Conference and Workshops on Automatic Face and Gesture Recognition, FG 2015
Y2 - 4 May 2015 through 8 May 2015
ER -