Résumé
We analyze the Factorization method to reconstruct the geometry of a local defect in a periodic absorbing layer using almost only incident plane waves at a fixed frequency. A crucial part of our analysis relies on the consideration of the range of a carefully designed far field operator, which characterizes the geometry of the defect. We further provide some validating numerical results in a two dimensional setting.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 133-152 |
| Nombre de pages | 20 |
| journal | Inverse Problems and Imaging |
| Volume | 14 |
| Numéro de publication | 1 |
| Les DOIs | |
| état | Publié - 1 janv. 2020 |
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