From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling

Loic Denis; Charles Alban Deledalle; Florence Tupin

doi:10.1109/IGARSS.2019.8898473

From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling

Loic Denis
, Charles Alban Deledalle
, Florence Tupin

University of Lyon
CNRS
Université Paris-Saclay

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

Résumé

Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.

langue originale	Anglais
titre	2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings
Editeur	Institute of Electrical and Electronics Engineers Inc.
Pages	5113-5116
Nombre de pages	4
ISBN (Electronique)	9781538691540
Les DOIs	https://doi.org/10.1109/IGARSS.2019.8898473
état	Publié - 1 juil. 2019
Modification externe	Oui
Evénement	39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Yokohama, Japon Durée: 28 juil. 2019 → 2 août 2019

Série de publications

Nom	International Geoscience and Remote Sensing Symposium (IGARSS)

Une conférence

Une conférence	39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019
Pays/Territoire	Japon
La ville	Yokohama
période	28/07/19 → 2/08/19

Accès au document

10.1109/IGARSS.2019.8898473

Contient cette citation

Denis, L., Deledalle, C. A., & Tupin, F. (2019). From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. Dans 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings (p. 5113-5116). Article 8898473 (International Geoscience and Remote Sensing Symposium (IGARSS)). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IGARSS.2019.8898473

Denis, Loic ; Deledalle, Charles Alban ; Tupin, Florence. / From Patches to Deep Learning : Combining Self-Similarity and Neural Networks for Sar Image Despeckling. 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 5113-5116 (International Geoscience and Remote Sensing Symposium (IGARSS)).

@inproceedings{0b3aaeec111748b886eb746a923c86e9,

title = "From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling",

abstract = "Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.",

keywords = "PolSAR, SAR, deep learning, non-local filtering, patches, speckle",

author = "Loic Denis and Deledalle, \{Charles Alban\} and Florence Tupin",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 ; Conference date: 28-07-2019 Through 02-08-2019",

year = "2019",

month = jul,

day = "1",

doi = "10.1109/IGARSS.2019.8898473",

language = "English",

series = "International Geoscience and Remote Sensing Symposium (IGARSS)",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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}

Denis, L, Deledalle, CA & Tupin, F 2019, From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. Dans 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings., 8898473, International Geoscience and Remote Sensing Symposium (IGARSS), Institute of Electrical and Electronics Engineers Inc., p. 5113-5116, 39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019, Yokohama, Japon, 28/07/19. https://doi.org/10.1109/IGARSS.2019.8898473

From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. / Denis, Loic; Deledalle, Charles Alban; Tupin, Florence.
2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 5113-5116 8898473 (International Geoscience and Remote Sensing Symposium (IGARSS)).

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

TY - GEN

T1 - From Patches to Deep Learning

T2 - 39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019

AU - Denis, Loic

AU - Deledalle, Charles Alban

AU - Tupin, Florence

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.

AB - Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.

KW - PolSAR

KW - SAR

KW - deep learning

KW - non-local filtering

KW - patches

KW - speckle

U2 - 10.1109/IGARSS.2019.8898473

DO - 10.1109/IGARSS.2019.8898473

M3 - Conference contribution

AN - SCOPUS:85077699475

T3 - International Geoscience and Remote Sensing Symposium (IGARSS)

SP - 5113

EP - 5116

BT - 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 28 July 2019 through 2 August 2019

ER -

Denis L, Deledalle CA, Tupin F. From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. Dans 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. p. 5113-5116. 8898473. (International Geoscience and Remote Sensing Symposium (IGARSS)). doi: 10.1109/IGARSS.2019.8898473

From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling

Résumé

Série de publications

Une conférence

Accès au document

Empreinte digitale

Contient cette citation