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Ge/SrTiO 3(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission

  • M. El Kazzi
  • , B. Gobaut
  • , J. Penuelas
  • , G. Grenet
  • , M. G. Silly
  • , F. Sirotti
  • , G. Saint-Girons
  • Synchrotron SOLEIL
  • LTDS UMR 5513 - Ecole Centrale de Lyon

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

Soft x-ray synchrotron-radiation photoemission has been used to study the interface between Ge and SrTiO 3(100). Mapping as annealing temperature varies reveals that Ge adsorption is strongly dependent on the SrTiO 3 surface's initial composition: the richer the surface is in TiO x, the more Ge wets the STO surface. Time-resolved photoemission has enabled us to monitor Ge bonding and desorption as a function of annealing temperature. As temperature increases, the Ge2 +, Ge +, and Ge0 component evolution reveals that Ge adatoms, initially bonded to two (or more) oxygen atoms gradually aggregate to form Ge clusters. Finally, the bonding is via a single oxygen atom, suggesting (111)-oriented clusters.

langue originaleAnglais
Numéro d'article075317
journalPhysical Review B - Condensed Matter and Materials Physics
Volume85
Numéro de publication7
Les DOIs
étatPublié - 22 févr. 2012
Modification externeOui

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