Résumé
Soft x-ray synchrotron-radiation photoemission has been used to study the interface between Ge and SrTiO 3(100). Mapping as annealing temperature varies reveals that Ge adsorption is strongly dependent on the SrTiO 3 surface's initial composition: the richer the surface is in TiO x, the more Ge wets the STO surface. Time-resolved photoemission has enabled us to monitor Ge bonding and desorption as a function of annealing temperature. As temperature increases, the Ge2 +, Ge +, and Ge0 component evolution reveals that Ge adatoms, initially bonded to two (or more) oxygen atoms gradually aggregate to form Ge clusters. Finally, the bonding is via a single oxygen atom, suggesting (111)-oriented clusters.
| langue originale | Anglais |
|---|---|
| Numéro d'article | 075317 |
| journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 85 |
| Numéro de publication | 7 |
| Les DOIs | |
| état | Publié - 22 févr. 2012 |
| Modification externe | Oui |
Empreinte digitale
Examiner les sujets de recherche de « Ge/SrTiO 3(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission ». Ensemble, ils forment une empreinte digitale unique.Contient cette citation
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver