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Hartmann wave-front measurement at 13.4 nm with λEUV/120 accuracy

  • Pascal Mercère
  • , Philippe Zeitoun
  • , Mourad Idir
  • , Sébastien Le Pape
  • , Denis Douillet
  • , Xavier Levecq
  • , Guillaume Dovillaire
  • , Samuel Bucourt
  • , Kenneth A. Goldberg
  • , Patrick P. Naulleau
  • , Senajith Rekawa
  • Université Paris-Saclay
  • Imagine Optic
  • Laboratory d'Optique Appliquée, ENSTA, CNRS-École Polytechnique
  • Ernest Orlando Lawrence Berkeley National Laboratory

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

We report, for the first time to our knowledge, experimental demonstration of wave-front analysis via the Hartmann technique in the extreme ultraviolet range. The reference wave front needed to calibrate the sensor was generated by spatially filtering a focused undulator beam with 1.7- and 0.6-μm-diameter pinholes. To fully characterize the sensor, accuracy and sensitivity measurements were performed. The incident beam's wavelength was varied from 7 to 25 nm. Measurements of accuracy better than λEUV/120 (0.11 nm) were obtained at λEUV = 13.4 nm. The aberrations introduced by an additional thin mirror, as well as wave front of the spatially unfiltered incident beam, were also measured.

langue originaleAnglais
Pages (de - à)1534-1536
Nombre de pages3
journalOptics Letters
Volume28
Numéro de publication17
Les DOIs
étatPublié - 1 sept. 2003
Modification externeOui

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