High-resolution X-ray diffraction and X-ray reflectivity studies of short-period CdTe/MnTe-superlattices

CdTe/MnTe superlattices have recently been focused on because of their magnetic properties, in particular, the magnetic coupling of the MnTe layers across the CdTe interlayers. The aim of the present paper is the determination of the structural parameters of short-period CdTe/MnTe superlattice samples by means of X-ray diffraction and X-ray reflectivity studies, as these parameters are essential for the interpretation of the experiments on the magnetic properties. Using X-ray diffraction, we obtained the layer structure and the strain status of the superlattices. From X-ray reflectivity, information on the interface morphology and the replication of the interface structure during the growth of the superlattices is obtained.