Imaging defects in an elastic waveguide using time-dependent surface data

V. Baronian; L. Bourgeois; B. Chapuis; A. Recoquillay

doi:10.1088/1742-6596/1131/1/012010

Imaging defects in an elastic waveguide using time-dependent surface data

V. Baronian
, L. Bourgeois
, B. Chapuis
, A. Recoquillay

CEA/UVSQ/CNRS

Résultats de recherche: Contribution à un journal › Article de conférence › Revue par des pairs

Résumé

We are interested here in applying the Linear Sampling Method to the context of Non Destructive Testing for waveguides. Specifically the Linear Sampling Method [1] in its modal form [2] is adapted to image defects in an elastic waveguide from realistic scattering data, that is data coming from sources and receivers on the surface of the waveguide in the time domain, as it has already been done in the acoustic case [16]. The obtained method is applied to artificial data and to experimental data in the special case of back-scattering.

langue originale	Anglais
Numéro d'article	012010
journal	Journal of Physics: Conference Series
Volume	1131
Numéro de publication	1
Les DOIs	https://doi.org/10.1088/1742-6596/1131/1/012010
état	Publié - 23 nov. 2018
Evénement	8th International Conference on New Computational Methods for Inverse Problems, NCMIP 2018 - Cachan, France Durée: 25 mai 2018 → …

Accès au document

10.1088/1742-6596/1131/1/012010

Contient cette citation

@article{9a7057bea8ca4e50af2f977a69465098,

title = "Imaging defects in an elastic waveguide using time-dependent surface data",

abstract = "We are interested here in applying the Linear Sampling Method to the context of Non Destructive Testing for waveguides. Specifically the Linear Sampling Method [1] in its modal form [2] is adapted to image defects in an elastic waveguide from realistic scattering data, that is data coming from sources and receivers on the surface of the waveguide in the time domain, as it has already been done in the acoustic case [16]. The obtained method is applied to artificial data and to experimental data in the special case of back-scattering.",

author = "V. Baronian and L. Bourgeois and B. Chapuis and A. Recoquillay",

note = "Publisher Copyright: {\textcopyright} Published under licence by IOP Publishing Ltd.; 8th International Conference on New Computational Methods for Inverse Problems, NCMIP 2018 ; Conference date: 25-05-2018",

year = "2018",

month = nov,

day = "23",

doi = "10.1088/1742-6596/1131/1/012010",

language = "English",

volume = "1131",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

}

TY - JOUR

T1 - Imaging defects in an elastic waveguide using time-dependent surface data

AU - Baronian, V.

AU - Bourgeois, L.

AU - Chapuis, B.

AU - Recoquillay, A.

N1 - Publisher Copyright: © Published under licence by IOP Publishing Ltd.

PY - 2018/11/23

Y1 - 2018/11/23

N2 - We are interested here in applying the Linear Sampling Method to the context of Non Destructive Testing for waveguides. Specifically the Linear Sampling Method [1] in its modal form [2] is adapted to image defects in an elastic waveguide from realistic scattering data, that is data coming from sources and receivers on the surface of the waveguide in the time domain, as it has already been done in the acoustic case [16]. The obtained method is applied to artificial data and to experimental data in the special case of back-scattering.

AB - We are interested here in applying the Linear Sampling Method to the context of Non Destructive Testing for waveguides. Specifically the Linear Sampling Method [1] in its modal form [2] is adapted to image defects in an elastic waveguide from realistic scattering data, that is data coming from sources and receivers on the surface of the waveguide in the time domain, as it has already been done in the acoustic case [16]. The obtained method is applied to artificial data and to experimental data in the special case of back-scattering.

U2 - 10.1088/1742-6596/1131/1/012010

DO - 10.1088/1742-6596/1131/1/012010

M3 - Conference article

AN - SCOPUS:85058271509

SN - 1742-6588

VL - 1131

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

M1 - 012010

T2 - 8th International Conference on New Computational Methods for Inverse Problems, NCMIP 2018

Y2 - 25 May 2018

ER -

Imaging defects in an elastic waveguide using time-dependent surface data

Résumé

Accès au document

Empreinte digitale

Contient cette citation