Imaging junctions of waveguides

Laurent Bourgeois; Jean François Fritsch; Arnaud Recoquillay

doi:10.3934/ipi.2020065

Imaging junctions of waveguides

Laurent Bourgeois
, Jean François Fritsch
, Arnaud Recoquillay

Laboratoire POems UMR 7231 CNRS-INRIA-ENSTA, ENSTA-UMA
Université Paris-Saclay

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

langue originale	Anglais
Pages (de - à)	285-314
Nombre de pages	30
journal	Inverse Problems and Imaging
Volume	15
Numéro de publication	2
Les DOIs	https://doi.org/10.3934/ipi.2020065
état	Publié - 1 janv. 2021

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10.3934/ipi.2020065

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title = "Imaging junctions of waveguides",

abstract = "In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.",

keywords = "Dirichlet-to-Neumann operator, Fundamental solution, Inverse scattering, Junction, Linear sampling method, Waveguide",

author = "Laurent Bourgeois and Fritsch, \{Jean Fran{\c c}ois\} and Arnaud Recoquillay",

year = "2021",

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doi = "10.3934/ipi.2020065",

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journal = "Inverse Problems and Imaging",

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AU - Fritsch, Jean François

AU - Recoquillay, Arnaud

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N2 - In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

AB - In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

KW - Dirichlet-to-Neumann operator

KW - Fundamental solution

KW - Inverse scattering

KW - Junction

KW - Linear sampling method

KW - Waveguide

UR - https://www.scopus.com/pages/publications/85103045470

U2 - 10.3934/ipi.2020065

DO - 10.3934/ipi.2020065

M3 - Article

AN - SCOPUS:85103045470

SN - 1930-8337

VL - 15

SP - 285

EP - 314

JO - Inverse Problems and Imaging

JF - Inverse Problems and Imaging

IS - 2

ER -

Imaging junctions of waveguides

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