In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

T. A. Pikuz; A. Ya Faenov; T. Matsuoka; B. Albertazzi; N. Ozaki; N. Hartely; O. Muray Ricardo Arturo; T. Yabuuchi; H. Habara; S. Matsuyama; K. Yamauchi; Y. Inubushi; T. Togashi; H. Yumoto; Y. Tange; K. Tono; Y. Sato; M. Yabashi; M. Nishikino; T. Kawachi; A. Mitrofanov; S. A. Pikuz; D. Bleiner; A. Grum-Grzhimailo; N. N. Rosanov; N. V. Vysotina; M. Harmand; M. Koenig; K. A. Tanaka; T. Ishikawa; R. Kodama

doi:10.1007/978-3-319-73025-7_17

In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

T. A. Pikuz
, A. Ya Faenov
, T. Matsuoka
, B. Albertazzi
, N. Ozaki
, N. Hartely
, O. Muray Ricardo Arturo
, T. Yabuuchi
, H. Habara
, S. Matsuyama
, K. Yamauchi
, Y. Inubushi
, T. Togashi
, H. Yumoto
, Y. Tange
, K. Tono
, Y. Sato
, M. Yabashi
, M. Nishikino
, T. Kawachi

A. Mitrofanov, S. A. Pikuz, D. Bleiner, A. Grum-Grzhimailo, N. N. Rosanov, N. V. Vysotina, M. Harmand, M. Koenig, K. A. Tanaka, T. Ishikawa, R. Kodama

Osaka University
Joint Institute for High Temperatures of the Russian Academy of Sciences
CEA/UVSQ/CNRS
Riken Harima Institute
JASRI/SPring-8
National Institutes for Quantum and Radiological Science and Technology
National Research Nuclear University MEPhI
Empa - Swiss Federal Laboratories for Materials Science and Technology
Moscow State University
STC Vavilov State Optical Institute
Université Pierre et Marie Curie

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

Résumé

We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimetres with high spatial resolution (~1 µm). In situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. Also, a high spatial resolution control a quality of targets used in optical laser pump—XFEL probe HEDS experiments is proposed.

langue originale	Anglais
titre	X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
rédacteurs en chef	Tetsuya Kawachi, Sergei V. Bulanov, Hiroyuki Daido, Yoshiaki Kato
Editeur	Springer Science and Business Media, LLC
Pages	109-115
Nombre de pages	7
ISBN (imprimé)	9783319730240
Les DOIs	https://doi.org/10.1007/978-3-319-73025-7_17
état	Publié - 1 janv. 2018
Modification externe	Oui
Evénement	15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japon Durée: 22 mai 2016 → 27 mai 2016

Série de publications

Nom	Springer Proceedings in Physics
Volume	202
ISSN (imprimé)	0930-8989
ISSN (Electronique)	1867-4941

Une conférence

Une conférence	15th International Conference on X-Ray Lasers, ICXRL 2016
Pays/Territoire	Japon
La ville	Nara
période	22/05/16 → 27/05/16

Accès au document

10.1007/978-3-319-73025-7_17

Contient cette citation

Pikuz, T. A., Faenov, A. Y., Matsuoka, T., Albertazzi, B., Ozaki, N., Hartely, N., Muray Ricardo Arturo, O., Yabuuchi, T., Habara, H., Matsuyama, S., Yamauchi, K., Inubushi, Y., Togashi, T., Yumoto, H., Tange, Y., Tono, K., Sato, Y., Yabashi, M., Nishikino, M., ... Kodama, R. (2018). In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector. Dans T. Kawachi, S. V. Bulanov, H. Daido, & Y. Kato (eds.), X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers (p. 109-115). (Springer Proceedings in Physics; Vol 202). Springer Science and Business Media, LLC. https://doi.org/10.1007/978-3-319-73025-7_17

Pikuz, T. A. ; Faenov, A. Ya ; Matsuoka, T. et al. / In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector. X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. Editeur / Tetsuya Kawachi ; Sergei V. Bulanov ; Hiroyuki Daido ; Yoshiaki Kato. Springer Science and Business Media, LLC, 2018. p. 109-115 (Springer Proceedings in Physics).

@inproceedings{2a27e9161bd54e9bb190a744dabd5184,

title = "In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector",

abstract = "We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimetres with high spatial resolution (\textasciitilde{}1 µm). In situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. Also, a high spatial resolution control a quality of targets used in optical laser pump—XFEL probe HEDS experiments is proposed.",

author = "Pikuz, \{T. A.\} and Faenov, \{A. Ya\} and T. Matsuoka and B. Albertazzi and N. Ozaki and N. Hartely and \{Muray Ricardo Arturo\}, O. and T. Yabuuchi and H. Habara and S. Matsuyama and K. Yamauchi and Y. Inubushi and T. Togashi and H. Yumoto and Y. Tange and K. Tono and Y. Sato and M. Yabashi and M. Nishikino and T. Kawachi and A. Mitrofanov and Pikuz, \{S. A.\} and D. Bleiner and A. Grum-Grzhimailo and Rosanov, \{N. N.\} and Vysotina, \{N. V.\} and M. Harmand and M. Koenig and Tanaka, \{K. A.\} and T. Ishikawa and R. Kodama",

note = "Publisher Copyright: {\textcopyright} 2018, Springer International Publishing AG.; 15th International Conference on X-Ray Lasers, ICXRL 2016 ; Conference date: 22-05-2016 Through 27-05-2016",

year = "2018",

month = jan,

day = "1",

doi = "10.1007/978-3-319-73025-7\_17",

language = "English",

isbn = "9783319730240",

series = "Springer Proceedings in Physics",

publisher = "Springer Science and Business Media, LLC",

pages = "109--115",

editor = "Tetsuya Kawachi and Bulanov, \{Sergei V.\} and Hiroyuki Daido and Yoshiaki Kato",

booktitle = "X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers",

}

Pikuz, TA, Faenov, AY, Matsuoka, T, Albertazzi, B, Ozaki, N, Hartely, N, Muray Ricardo Arturo, O, Yabuuchi, T, Habara, H, Matsuyama, S, Yamauchi, K, Inubushi, Y, Togashi, T, Yumoto, H, Tange, Y, Tono, K, Sato, Y, Yabashi, M, Nishikino, M, Kawachi, T, Mitrofanov, A, Pikuz, SA, Bleiner, D, Grum-Grzhimailo, A, Rosanov, NN, Vysotina, NV, Harmand, M, Koenig, M, Tanaka, KA, Ishikawa, T & Kodama, R 2018, In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector. Dans T Kawachi, SV Bulanov, H Daido & Y Kato (eds), X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. Springer Proceedings in Physics, VOL. 202, Springer Science and Business Media, LLC, p. 109-115, 15th International Conference on X-Ray Lasers, ICXRL 2016, Nara, Japon, 22/05/16. https://doi.org/10.1007/978-3-319-73025-7_17

In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector. / Pikuz, T. A.; Faenov, A. Ya; Matsuoka, T. et al.
X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. Ed. / Tetsuya Kawachi; Sergei V. Bulanov; Hiroyuki Daido; Yoshiaki Kato. Springer Science and Business Media, LLC, 2018. p. 109-115 (Springer Proceedings in Physics; Vol 202).

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

TY - GEN

T1 - In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

AU - Pikuz, T. A.

AU - Faenov, A. Ya

AU - Matsuoka, T.

AU - Albertazzi, B.

AU - Ozaki, N.

AU - Hartely, N.

AU - Muray Ricardo Arturo, O.

AU - Yabuuchi, T.

AU - Habara, H.

AU - Matsuyama, S.

AU - Yamauchi, K.

AU - Inubushi, Y.

AU - Togashi, T.

AU - Yumoto, H.

AU - Tange, Y.

AU - Tono, K.

AU - Sato, Y.

AU - Yabashi, M.

AU - Nishikino, M.

AU - Kawachi, T.

AU - Mitrofanov, A.

AU - Pikuz, S. A.

AU - Bleiner, D.

AU - Grum-Grzhimailo, A.

AU - Rosanov, N. N.

AU - Vysotina, N. V.

AU - Harmand, M.

AU - Koenig, M.

AU - Tanaka, K. A.

AU - Ishikawa, T.

AU - Kodama, R.

PY - 2018/1/1

Y1 - 2018/1/1

N2 - We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimetres with high spatial resolution (~1 µm). In situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. Also, a high spatial resolution control a quality of targets used in optical laser pump—XFEL probe HEDS experiments is proposed.

AB - We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimetres with high spatial resolution (~1 µm). In situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. Also, a high spatial resolution control a quality of targets used in optical laser pump—XFEL probe HEDS experiments is proposed.

U2 - 10.1007/978-3-319-73025-7_17

DO - 10.1007/978-3-319-73025-7_17

M3 - Conference contribution

AN - SCOPUS:85043348993

SN - 9783319730240

T3 - Springer Proceedings in Physics

SP - 109

EP - 115

BT - X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers

A2 - Kawachi, Tetsuya

A2 - Bulanov, Sergei V.

A2 - Daido, Hiroyuki

A2 - Kato, Yoshiaki

PB - Springer Science and Business Media, LLC

T2 - 15th International Conference on X-Ray Lasers, ICXRL 2016

Y2 - 22 May 2016 through 27 May 2016

ER -

Pikuz TA, Faenov AY, Matsuoka T, Albertazzi B, Ozaki N, Hartely N et al. In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector. Dans Kawachi T, Bulanov SV, Daido H, Kato Y, rédacteurs en chef, X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. Springer Science and Business Media, LLC. 2018. p. 109-115. (Springer Proceedings in Physics). doi: 10.1007/978-3-319-73025-7_17

In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

Résumé

Série de publications

Une conférence

Accès au document

Empreinte digitale

Contient cette citation