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In situ kinetic analysis of SiC filaments CVD

  • O. Féron
  • , G. Chollon
  • , F. Dartigues
  • , F. Langlais
  • , R. Naslain
  • Univ. Bordeaux
  • Institut de Chimie de la Matière Condensée de Bordeaux

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

17 Citations (Scopus)

Résumé

An in situ kinetic study of the SiC-based filament CVD from DCMS/H2 and DCMS/C3H6/H2 mixtures has been carried out. The results evidenced a low temperature regime (T<1150 °C) controlled by surface chemical reactions and a high temperature domain (T> 1150 °C) governed by the diffusion of reactive species to the substrate (mass transfer regime). The addition of propene to the DCMS/H2 mixture leads to the decrease of the deposition rate, the increase of the activation energy (within the surface reaction limited regime) and the increase of the C/Si (at.) ratio. The dilution of DCMS in H2 promotes the co-deposition of free silicon. Conversely, the addition of propene results in lower amounts of free silicon or even traces of free carbon for high deposition temperatures. The increase of the C/Si (at.) ratio observed in presence of propene might be related to the inhibition of the deposition of Si-rich species derived from DCMS, through reactions with propene or related unsaturated hydrocarbons in the gas phase.

langue originaleAnglais
Pages (de - à)1234-1238
Nombre de pages5
journalDiamond and Related Materials
Volume11
Numéro de publication3-6
Les DOIs
étatPublié - 1 mars 2002
Modification externeOui

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