TY - GEN
T1 - Influence of Magnetic Field on Microwave Impedance of Composite Films (CoFeB+SiO2)
AU - Kotov, Leonid
AU - Lasek, Michail
AU - Vlasov, Vladimir
AU - Kalinin, Yuri
AU - Sitnikov, Alexander
AU - Temnov, Vasily
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023/1/1
Y1 - 2023/1/1
N2 - Radio Frequency (RF) impedance of metal- dielectric films [ (CoFeB)x+ (SiO2)(1-x)], x = 0.76, 0.88, 0.9 in the frequency range 0.1-3 GHz at room temperature were obtained in the work. Magnetic phase contrast (MPC) images of film surface fragments were obtained using an atomic force microscope. A stripe magnetic structure in the film at x = 0.76 before and after magnetization of the film in a magnetic field of 0.7 Tesla was discovered. The clarity of the magnetic domain structure image after magnetization of this film was observed to decrease. Deep minima of the magnetic impedance M (f) in the frequency range 1-2.5 GHz were observed in the studied composite films. The depth of the magnetic impedance minima for all films in the M (f) dependence decreases with increasing induction of the magnetic field in which the film is located, it was shown. The minima of M (f) for films at x=0.76 shift towards lower frequencies after magnetization of the films under the influence of a magnetic field Bo=0.7 T. The M (f) minima for films at x=0.88 do not shift under the influence of a magnetic field. This film at x=0.88 is characterized by the presence of extended inhomogeneous magnetic stripes, which significantly reduce the microwave mobility of the magnetic structure. The shift in the minimum of the microwave spectrum and the decrease in the amplitude of the minimums are associated with a change in the magnetic structure of the films when they are magnetized in a magnetic field of 0.7 Tesla.
AB - Radio Frequency (RF) impedance of metal- dielectric films [ (CoFeB)x+ (SiO2)(1-x)], x = 0.76, 0.88, 0.9 in the frequency range 0.1-3 GHz at room temperature were obtained in the work. Magnetic phase contrast (MPC) images of film surface fragments were obtained using an atomic force microscope. A stripe magnetic structure in the film at x = 0.76 before and after magnetization of the film in a magnetic field of 0.7 Tesla was discovered. The clarity of the magnetic domain structure image after magnetization of this film was observed to decrease. Deep minima of the magnetic impedance M (f) in the frequency range 1-2.5 GHz were observed in the studied composite films. The depth of the magnetic impedance minima for all films in the M (f) dependence decreases with increasing induction of the magnetic field in which the film is located, it was shown. The minima of M (f) for films at x=0.76 shift towards lower frequencies after magnetization of the films under the influence of a magnetic field Bo=0.7 T. The M (f) minima for films at x=0.88 do not shift under the influence of a magnetic field. This film at x=0.88 is characterized by the presence of extended inhomogeneous magnetic stripes, which significantly reduce the microwave mobility of the magnetic structure. The shift in the minimum of the microwave spectrum and the decrease in the amplitude of the minimums are associated with a change in the magnetic structure of the films when they are magnetized in a magnetic field of 0.7 Tesla.
KW - Radio frequency impedance
KW - composite
KW - constant magnetic field
KW - magnetic phase contrast
KW - magnetic structure
KW - metal alloy
KW - metal-dielectric films
UR - https://www.scopus.com/pages/publications/85186501898
U2 - 10.1109/NEleX59773.2023.10421632
DO - 10.1109/NEleX59773.2023.10421632
M3 - Conference contribution
AN - SCOPUS:85186501898
T3 - 2023 International Conference on Next Generation Electronics, NEleX 2023
BT - 2023 International Conference on Next Generation Electronics, NEleX 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE International Conference on Next Generation Electronics, NEleX 2023
Y2 - 14 December 2023 through 16 December 2023
ER -