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Interface properties and passivation of p-Si(1 1 1) surfaces by electrochemical organic layer deposition

  • A. G. Güell
  • , K. Roodenko
  • , F. Yang
  • , K. Hinrichs
  • , M. Gensch
  • , F. Sanz
  • , J. Rappich
  • University of Barcelona
  • ISAS Institute for Analytical Sciences
  • Helmholtz-Zentrum Berlin für Materialien und Energie GmbH

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

The grafting of nitrobenzene and bromobenzene onto H-terminated p-Si(1 1 1) surfaces in the presence of HF in the aqueous diazonium salt containing solution was investigated by in situ photoluminescence (PL) and ex situ infrared ellipsometric spectroscopy (IR-SE). The PL measurements revealed that the grafting process is faster for nitrobenzene and that the Si-phenyl interface is well passivated. Aging experiments in ambient air showed that the organic layers on Si have a better stability against oxidation and therefore, against defect formation than the H-terminated Si(1 1 1) surface.

langue originaleAnglais
Pages (de - à)273-276
Nombre de pages4
journalMaterials Science and Engineering: B
Volume134
Numéro de publication2-3 SPEC. ISS.
Les DOIs
étatPublié - 15 oct. 2006
Modification externeOui

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