Résumé
Relative measurement of the phase of the surface second-order susceptibility is shown to be easily obtained in a surface second-harmonic generation experiment by inserting a quarter-wave plate on the fundamental and measuring the second-harmonic intensity vs. the fundamental ellipticity. This technique is applied to two samples: an isotropic surface of chiral molecules and a calcite crystal. In both cases, a dephasing between the different susceptibility components is observed.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 321-323 |
| Nombre de pages | 3 |
| journal | Applied Physics B: Lasers and Optics |
| Volume | 68 |
| Numéro de publication | 2-3 |
| Les DOIs | |
| état | Publié - 1 janv. 1999 |
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