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Ion-beam mixing of metal-insulator multilayers: A promising technique for the formation of metallic nanophases

  • G. Rizza
  • , F. Garrido
  • , J. C. Pivin
  • , J. C. Dran
  • , L. Thomé
  • , M. Gusso
  • , L. Tapfer
  • , A. Quaranta
  • , P. Colombo
  • Université Paris-Sud
  • Ctro. Naz. Richerca S.
  • Università di Milano-Bicocca
  • Università di Trento
  • University of Padova

Résultats de recherche: Contribution à un journalArticleRevue par des pairs

Résumé

The presence of metallic nanoclusters in an insulating matrix leads to non-linear optical properties with potential applications in optoelectronics. Ion implantation is currently used to produce such a composite material with limitations inherent to the implantation process, particularly concerning the doped thickness and the homogeneity of the transformed layer. Here we show that high-energy ion-beam mixing can be applied as an alternative ion beam technique to form metallic nanoclusters without the drawbacks of direct ion implantation. Thin SiO2-metal multilayers were irradiated at room temperature with MeV heavy ions in order to produce an homogeneous SiO2 layer containing metallic nanoclusters over the whole sample thickness. The present works deals with the mechanism leading to the formation of metallic nanophases by ion-beam mixing.

langue originaleAnglais
Pages (de - à)574-578
Nombre de pages5
journalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume127-128
Les DOIs
étatPublié - 1 janv. 1997
Modification externeOui

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