Résumé
Using the dielectric resonator method, we have investigated nonlinearities in the surface impedance Zs = Rs +j Xs of YBa2 Cu3 O7-δ thin films at 10 GHz as a function of the incident microwave power level and temperature. The use of a rutile dielectric resonator allows us to measure the precise temperature of the films. We conclusively show that the usually observed increase in the surface resistance of YBa2 Cu3 O7-δ thin film as a function of microwave power is due to local heating.
| langue originale | Anglais |
|---|---|
| Numéro d'article | 023912 |
| journal | Journal of Applied Physics |
| Volume | 106 |
| Numéro de publication | 2 |
| Les DOIs | |
| état | Publié - 1 janv. 2009 |
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