Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix

Hicham Ezzat; Lírida Naviner

doi:10.1109/ISQED.2010.5450527

Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix

Hicham Ezzat
, Lírida Naviner

CNRS LTCI
UFE - Université Française d'Egypte

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

3 Citations (Scopus)

Résumé

As CMOS technology is reaching the nanometer scale, transient and intermittent faults occurrence in logic circuits, which implies a reliability degradation, can no longer be neglected. This paper deals with reliability evaluation which is a critical parameter in circuit design. The proposed method is scalable, iterative and accelerates the reliability analysis.

langue originale	Anglais
titre	Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
Pages	524-527
Nombre de pages	4
Les DOIs	https://doi.org/10.1109/ISQED.2010.5450527
état	Publié - 28 mai 2010
Modification externe	Oui
Evénement	11th International Symposium on Quality Electronic Design, ISQED 2010 - San Jose, CA, États-Unis Durée: 22 mars 2010 → 24 mars 2010

Série de publications

Nom	Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010

Une conférence

Une conférence	11th International Symposium on Quality Electronic Design, ISQED 2010
Pays/Territoire	États-Unis
La ville	San Jose, CA
période	22/03/10 → 24/03/10

Accès au document

10.1109/ISQED.2010.5450527

Contient cette citation

Ezzat, H., & Naviner, L. (2010). Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. Dans Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010 (p. 524-527). Article 5450527 (Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010). https://doi.org/10.1109/ISQED.2010.5450527

@inproceedings{0e17917f6c69404d83b41b1529b9118e,

title = "Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix",

abstract = "As CMOS technology is reaching the nanometer scale, transient and intermittent faults occurrence in logic circuits, which implies a reliability degradation, can no longer be neglected. This paper deals with reliability evaluation which is a critical parameter in circuit design. The proposed method is scalable, iterative and accelerates the reliability analysis.",

author = "Hicham Ezzat and L{\'i}rida Naviner",

year = "2010",

month = may,

day = "28",

doi = "10.1109/ISQED.2010.5450527",

language = "English",

isbn = "9781424464555",

series = "Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010",

pages = "524--527",

booktitle = "Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010",

note = "11th International Symposium on Quality Electronic Design, ISQED 2010 ; Conference date: 22-03-2010 Through 24-03-2010",

}

Ezzat, H & Naviner, L 2010, Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. Dans Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010., 5450527, Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010, p. 524-527, 11th International Symposium on Quality Electronic Design, ISQED 2010, San Jose, CA, États-Unis, 22/03/10. https://doi.org/10.1109/ISQED.2010.5450527

Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. / Ezzat, Hicham; Naviner, Lírida.
Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010. 2010. p. 524-527 5450527 (Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010).

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collection › Contribution à une conférence › Revue par des pairs

TY - GEN

T1 - Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix

AU - Ezzat, Hicham

AU - Naviner, Lírida

PY - 2010/5/28

Y1 - 2010/5/28

N2 - As CMOS technology is reaching the nanometer scale, transient and intermittent faults occurrence in logic circuits, which implies a reliability degradation, can no longer be neglected. This paper deals with reliability evaluation which is a critical parameter in circuit design. The proposed method is scalable, iterative and accelerates the reliability analysis.

AB - As CMOS technology is reaching the nanometer scale, transient and intermittent faults occurrence in logic circuits, which implies a reliability degradation, can no longer be neglected. This paper deals with reliability evaluation which is a critical parameter in circuit design. The proposed method is scalable, iterative and accelerates the reliability analysis.

U2 - 10.1109/ISQED.2010.5450527

DO - 10.1109/ISQED.2010.5450527

M3 - Conference contribution

AN - SCOPUS:77952622244

SN - 9781424464555

T3 - Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010

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EP - 527

BT - Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010

T2 - 11th International Symposium on Quality Electronic Design, ISQED 2010

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Ezzat H, Naviner L. Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. Dans Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010. 2010. p. 524-527. 5450527. (Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010). doi: 10.1109/ISQED.2010.5450527

Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix

Résumé

Série de publications

Une conférence

Accès au document

Empreinte digitale

Contient cette citation