Résumé
The positron annihilation method was used to investigate the DX(Si) and DX(Te) centers in n-type AlGaAs. A vacancy defect is observed in the ground state of the DX centers. The vacancy signal disappears in shallow donor state reached at low temperatures by illuminating the sample. The size of the vacancy is smaller compared with isolated As and Ga vacancies. Our results are in good agreement with the vacancy-interstitial model of the DX center.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 1073-1078 |
| Nombre de pages | 6 |
| journal | Materials Science Forum |
| Volume | 196-201 |
| Numéro de publication | pt 2 |
| Les DOIs | |
| état | Publié - 1 janv. 1995 |
| Modification externe | Oui |
| Evénement | Proceedings of the 1995 18th International Conference on Defects in Semiconductors, ICDS-18. Part 1 (of 4) - Sendai, Jpn Durée: 23 juil. 1995 → 28 juil. 1995 |
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