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Measurement of the modulation transfer function (MTF) of a camera lens

  • Aline Vernier
  • , Baptiste Perrin
  • , Thierry Avignon
  • , Jean Augereau
  • , Lionel Jacubowiez

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collectionContribution à une conférenceRevue par des pairs

Résumé

An accurate characterization of optical elements is one of the pivotal skills to be learnt in the context of undergraduate optics lab work or that of continuing education. We will show an experimental apparatus designed to measure the Modulation Transfer Function (MTF) of a camera lens. The educational scope of this apparatus ranges from the study of the aberrations of the lens and its suitability for use with a given sensor, to the design of the test bench itself. A first, purely visual observation allows the trainees to single-out the aberrations exhibited by an objective. The presence of the spherical and chromatic aberrations on the axis of the objective is thus identified, and a first estimate of the cut-off frequency of this objective can be given. There, the importance of the geometrical extent of the source and the impact of the optical elements of the test bench on the measurement can also be assessed. The second part of the experiment makes use of a CMOS camera to measure the Linear Spread Function (LSF) of the camera lens and the MTF is then retrieved by Fourier transform. The experimental setup consists of a fine slit as a source, a collimator, the studied objective exhibiting conspicuous aberrations and a microscope objective to re-image the LSF either for direct observation with an eye-piece or for analysis with the camera. The latter is performed with a home-developed Matlab software.

langue originaleAnglais
titreEducation and Training in Optics and Photonics
Sous-titreETOP 2015
rédacteurs en chefEric Cormier, Laurent Sarger
EditeurSPIE
ISBN (Electronique)9781510600287
Les DOIs
étatPublié - 1 janv. 2015
Modification externeOui
EvénementEducation and Training in Optics and Photonics, ETOP 2015 - Bordeaux, France
Durée: 29 juin 20152 juil. 2015

Série de publications

NomProceedings of SPIE - The International Society for Optical Engineering
Volume9793
ISSN (imprimé)0277-786X
ISSN (Electronique)1996-756X

Une conférence

Une conférenceEducation and Training in Optics and Photonics, ETOP 2015
Pays/TerritoireFrance
La villeBordeaux
période29/06/152/07/15

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