MEPHISTO spectromicroscope reaches 20 nm lateral resolution

Gelsomina De Stasio; Luca Perfetti; B. Gilbert; O. Fauchoux; M. Capozi; P. Perfetti; G. Margaritondo; B. P. Tonner

doi:10.1063/1.1149661

MEPHISTO spectromicroscope reaches 20 nm lateral resolution

Gelsomina De Stasio
, Luca Perfetti
, B. Gilbert
, O. Fauchoux
, M. Capozi
, P. Perfetti
, G. Margaritondo
, B. P. Tonner

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

The recently described tests of the synchrotron imaging photoelectron spectromicroscope MEPHISTO (Microscope à Emission de PHotoélectrons par Illumination Synchrotronique de Type Onduleur) were complemented by further resolution improvements and tests, which brought the lateral resolution down to 20 nm. Images and line plot profiles demonstrate such performance.

langue originale	Anglais
Pages (de - à)	1740-1742
Nombre de pages	3
journal	Review of Scientific Instruments
Volume	70
Numéro de publication	3
Les DOIs	https://doi.org/10.1063/1.1149661
état	Publié - 1 janv. 1999

Accès au document

10.1063/1.1149661

Autres fichiers et liens

Lien vers la publication dans Scopus

Contient cette citation

@article{e2f2309c38a34bccb6e071b05f5c9aea,

title = "MEPHISTO spectromicroscope reaches 20 nm lateral resolution",

abstract = "The recently described tests of the synchrotron imaging photoelectron spectromicroscope MEPHISTO (Microscope {\`a} Emission de PHoto{\'e}lectrons par Illumination Synchrotronique de Type Onduleur) were complemented by further resolution improvements and tests, which brought the lateral resolution down to 20 nm. Images and line plot profiles demonstrate such performance.",

author = "\{De Stasio\}, Gelsomina and Luca Perfetti and B. Gilbert and O. Fauchoux and M. Capozi and P. Perfetti and G. Margaritondo and Tonner, \{B. P.\}",

year = "1999",

month = jan,

day = "1",

doi = "10.1063/1.1149661",

language = "English",

volume = "70",

pages = "1740--1742",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

number = "3",

}

TY - JOUR

T1 - MEPHISTO spectromicroscope reaches 20 nm lateral resolution

AU - De Stasio, Gelsomina

AU - Perfetti, Luca

AU - Gilbert, B.

AU - Fauchoux, O.

AU - Capozi, M.

AU - Perfetti, P.

AU - Margaritondo, G.

AU - Tonner, B. P.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - The recently described tests of the synchrotron imaging photoelectron spectromicroscope MEPHISTO (Microscope à Emission de PHotoélectrons par Illumination Synchrotronique de Type Onduleur) were complemented by further resolution improvements and tests, which brought the lateral resolution down to 20 nm. Images and line plot profiles demonstrate such performance.

AB - The recently described tests of the synchrotron imaging photoelectron spectromicroscope MEPHISTO (Microscope à Emission de PHotoélectrons par Illumination Synchrotronique de Type Onduleur) were complemented by further resolution improvements and tests, which brought the lateral resolution down to 20 nm. Images and line plot profiles demonstrate such performance.

UR - https://www.scopus.com/pages/publications/0001482406

U2 - 10.1063/1.1149661

DO - 10.1063/1.1149661

M3 - Article

AN - SCOPUS:0001482406

SN - 0034-6748

VL - 70

SP - 1740

EP - 1742

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

ER -

MEPHISTO spectromicroscope reaches 20 nm lateral resolution

Résumé

Accès au document

Autres fichiers et liens

Empreinte digitale

Contient cette citation