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Metric Learning for Fingerprint RSSI-Localization

  • Kevin Elgui
  • , Pascal Bianchi
  • , Olivier Isson
  • , Francois Portier
  • , Renaud Marty
  • Telecom Paris
  • Sigfox

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collectionContribution à une conférenceRevue par des pairs

2 Citations (Scopus)

Résumé

In this paper, we describe a framework dedicated to the geolocation of devices that can only be positioned in a set of specific locations called points of interest (noted PoIs). After a short introduction explaining the importance of this topic, a machine learning approach of this problem will be formalized and some of the off-the-shelf predictors that can be used to solve this geolocation problem will be discussed. Based on this review, the k-nearest neighbors (k-NN) method appears interesting for business applications due to its simplicity and reasonable effectiveness. We will then show that a gradient boosting metric learning enables to improve the k-NN weights and therefore leads to better performances with respect to the classical Euclidean distance choice for the similarity metric. We will discuss the effectiveness of this approach in our case consisting of a RSSI-localization task in high a dimensional space.

langue originaleAnglais
titre2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages1036-1042
Nombre de pages7
ISBN (Electronique)9781728102443
Les DOIs
étatPublié - 1 avr. 2020
Evénement2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020 - Portland, États-Unis
Durée: 20 avr. 202023 avr. 2020

Série de publications

Nom2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020

Une conférence

Une conférence2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020
Pays/TerritoireÉtats-Unis
La villePortland
période20/04/2023/04/20

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