Model dielectric function of amorphous materials including Urbach tail

M. Foldyna; K. Postava; J. Bouchala; J. Pištora; T. Yamaguchi

doi:10.1117/12.560673

Model dielectric function of amorphous materials including Urbach tail

M. Foldyna
, K. Postava
, J. Bouchala
, J. Pištora
, T. Yamaguchi

Technical University Ostrava
Shizuoka University

Résultats de recherche: Contribution à un journal › Article de conférence › Revue par des pairs

Résumé

A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Krönig dispersion relations. The model is applied to hydrogenated amorphous silicon.

langue originale	Anglais
Pages (de - à)	301-305
Nombre de pages	5
journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5445
Les DOIs	https://doi.org/10.1117/12.560673
état	Publié - 6 juil. 2004
Modification externe	Oui
Evénement	Microwave and Optical Technology 2003 - Ostrava, République tchcque Durée: 11 août 2003 → 15 août 2003

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10.1117/12.560673

Contient cette citation

@article{76d4749975e3499b802d007965ad418a,

title = "Model dielectric function of amorphous materials including Urbach tail",

abstract = "A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Kr{\"o}nig dispersion relations. The model is applied to hydrogenated amorphous silicon.",

keywords = "Amorphous materials, Model dielectric function, Spectroscopic ellipsometry, Tauc-Lorentz model, Urbach tail",

author = "M. Foldyna and K. Postava and J. Bouchala and J. Pi{\v s}tora and T. Yamaguchi",

year = "2004",

month = jul,

day = "6",

doi = "10.1117/12.560673",

language = "English",

volume = "5445",

pages = "301--305",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

note = "Microwave and Optical Technology 2003 ; Conference date: 11-08-2003 Through 15-08-2003",

}

TY - JOUR

T1 - Model dielectric function of amorphous materials including Urbach tail

AU - Foldyna, M.

AU - Postava, K.

AU - Bouchala, J.

AU - Pištora, J.

AU - Yamaguchi, T.

PY - 2004/7/6

Y1 - 2004/7/6

N2 - A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Krönig dispersion relations. The model is applied to hydrogenated amorphous silicon.

AB - A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Krönig dispersion relations. The model is applied to hydrogenated amorphous silicon.

KW - Amorphous materials

KW - Model dielectric function

KW - Spectroscopic ellipsometry

KW - Tauc-Lorentz model

KW - Urbach tail

U2 - 10.1117/12.560673

DO - 10.1117/12.560673

M3 - Conference article

AN - SCOPUS:3042682283

SN - 0277-786X

VL - 5445

SP - 301

EP - 305

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Microwave and Optical Technology 2003

Y2 - 11 August 2003 through 15 August 2003

ER -

Model dielectric function of amorphous materials including Urbach tail

Résumé

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