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Modeling and characterization of pulse shape and pulse train dynamics in two-section passively mode-locked quantum dot lasers

  • R. Raghunathan
  • , J. K. Mee
  • , M. T. Crowley
  • , F. Grillot
  • , V. Kovanis
  • , L. F. Lester
  • University of New Mexico
  • Kirtland Air Force Base
  • BinOptics Corporation
  • CNRS LTCI

Résultats de recherche: Le chapitre dans un livre, un rapport, une anthologie ou une collectionContribution à une conférenceRevue par des pairs

Résumé

A nonlinear delay differential equation model for passive mode-locking in semiconductor lasers, seeded with parameters extracted from the gain and loss spectra of a quantum dot laser, is employed to simulate and study the dynamical regimes of mode-locked operation of the device. The model parameter ranges corresponding to these regimes are then mapped to externally-controllable parameters such as gain current and absorber bias voltage. Using this approach, a map indicating the approximate regions corresponding to fundamental and harmonically mode locked operation is constructed as a function of gain current and absorber bias voltage. This is shown to be a highly useful method of getting a sense of the highest repetition rates achievable in principle with a simple, two-section device, and provides a guideline toward achieving higher repetition rates by simply adjusting external biasing conditions instantaneously while the device is in operation, as opposed to re-engineering the device with additional passive or saturable absorber sections. The general approach could potentially aid the development of numerical modeling techniques aimed at providing a systematic guideline geared toward developing microwave and RF photonic sources for THz applications.

langue originaleAnglais
titrePhysics and Simulation of Optoelectronic Devices XXI
Les DOIs
étatPublié - 29 mai 2013
Modification externeOui
EvénementPhysics and Simulation of Optoelectronic Devices XXI - San Francisco, CA, États-Unis
Durée: 4 févr. 20137 févr. 2013

Série de publications

NomProceedings of SPIE - The International Society for Optical Engineering
Volume8619
ISSN (imprimé)0277-786X

Une conférence

Une conférencePhysics and Simulation of Optoelectronic Devices XXI
Pays/TerritoireÉtats-Unis
La villeSan Francisco, CA
période4/02/137/02/13

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