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Multi-label Classification with Meta-Labels

  • Helsinki Institute for Information Technology
  • University of Waikato
  • Huawei Noah's Ark Lab

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Résumé

The area of multi-label classification has rapidly developed in recent years. It has become widely known that the baseline binary relevance approach can easily be outperformed by methods which learn labels together. A number of methods have grown around the label power set approach, which models label combinations together as class values in a multi-class problem. We describe the label-power set-based solutions under a general framework of meta-labels and provide some theoretical justification for this framework which has been lacking, explaining how meta-labels essentially allow a random projection into a space where non-linearities can easily be tackled with established linear learning algorithms. The proposed framework enables comparison and combination of related approaches to different multi-label problems. We present a novel model in the framework and evaluate it empirically against several high-performing methods, with respect to predictive performance and scalability, on a number of datasets and evaluation metrics. This deployment obtains competitive accuracy for a fraction of the computation required by the current meta-label methods for multi-label classification.

langue originaleAnglais
titreProceedings - 14th IEEE International Conference on Data Mining, ICDM 2014
rédacteurs en chefRavi Kumar, Hannu Toivonen, Jian Pei, Joshua Zhexue Huang, Xindong Wu
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages941-946
Nombre de pages6
EditionJanuary
ISBN (Electronique)9781479943029
Les DOIs
étatPublié - 1 janv. 2014
Modification externeOui
Evénement14th IEEE International Conference on Data Mining, ICDM 2014 - Shenzhen, Chine
Durée: 14 déc. 201417 déc. 2014

Série de publications

NomProceedings - IEEE International Conference on Data Mining, ICDM
nombreJanuary
Volume2015-January
ISSN (imprimé)1550-4786

Une conférence

Une conférence14th IEEE International Conference on Data Mining, ICDM 2014
Pays/TerritoireChine
La villeShenzhen
période14/12/1417/12/14

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