@inproceedings{35c16e20dba64b40a7637b334ffb28a1,
title = "Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging",
abstract = "Multi-lateral shearing interferometry [1] is an evolution of the classical lateral shearing interferometry: a grating based technique used for optical testing. Firstly developed for adaptive optics, for ultra-intense lasers characterization, or for lens testing, in visible or infrared, it has now been applied to visible quantitative phase microscopy of biological samples. The purpose of this paper is to present the transfer of this technique to the X-ray domain, stressing on the basic property of propagation invariance.",
keywords = "Multi Lateral Shearing Interferometry, X-ray, grating interferometry, microscopy, phase contrast imaging",
author = "J{\'e}r{\^o}me Primot and Julien Rizzi and Pascal Merc{\`e}re and Mourad Idir and Pierre Bon and Benoit Wattellier and Guillaume Druart and Gr{\'e}gory Vincent and Riad Ha{\"i}dar and Timm Weitkamp and Nicolas Gu{\'e}rineau and Serge Monneret",
year = "2012",
month = dec,
day = "1",
doi = "10.1063/1.4742266",
language = "English",
isbn = "9780735410725",
series = "AIP Conference Proceedings",
pages = "35--40",
booktitle = "International Workshop on X-Ray and Neutron Phase Imaging with Gratings",
note = "International Workshop on X-Ray and Neutron Phase Imaging with Gratings, XNPIG 2012 ; Conference date: 05-03-2012 Through 07-03-2012",
}