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New Methodology for Anisotropic Nanoparticles Characterization by Depolarized Light Scattering Measurements: Length and Diameter Determination of Rod-Like Nanoparticles

  • Benoit Maxit
  • , Clara Catros
  • , Julien Le Mener
  • , Florian Aubrit
  • , Olivier Sandre
  • , David Jacob
  • , Sylvain Boj
  • Cordouan Technologies
  • CNRS

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Résumé

In this work, we introduce a new setup and a method for characterizing anisotropic nanoparticles using a multi-angle polarization dynamic light scattering technique. This method is based on the measurement of the correlograms of scattered light intensity fluctuations both in the parallel and crossed polarizer configurations, and possibly concomitantly, from which the rotational and translational diffusion coefficients are extracted. By inversing the mathematical expressions of these coefficients, this approach allows the rapid determination of length and diameter of the anisotropic nanoparticles, enabling kinetic measurements. A comparison of experimental results obtained with this multi-angle depolarized DLS (DDLS) method to classical TEM images is discussed.

langue originaleAnglais
titre2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024
rédacteurs en chefCor Claeys, Beichao Zhang, Bin Yu, Ru Huang, Xiaowei Li, Steve X. Liang, Jianshi Tang, Hsiang-Lan Lung, Linyong Pang, Weikang Qian, Xinping Qu, Xiaoping Shi, Ying Zhang
EditeurInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronique)9798350362190
Les DOIs
étatPublié - 1 janv. 2024
Evénement2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024 - Shanghai, Chine
Durée: 17 mars 202418 mars 2024

Série de publications

Nom2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024

Une conférence

Une conférence2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024
Pays/TerritoireChine
La villeShanghai
période17/03/2418/03/24

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