Résumé
Positron annihilation experiments have been performed to investigate the compensating defects in silicon δ-doping superlattices in (001) GaAs. The results reveal vacancies and ion-type defects, which are located between the delta planes in undoped GaAs. The vacancy defect is identified as the Ga vacancy and the negative ion is attributed to the Ga antisite. The concentrations of these defects increase strongly, when the areal concentrations of free carriers are reduced at the delta planes.
| langue originale | Anglais |
|---|---|
| Pages (de - à) | 1843-1845 |
| Nombre de pages | 3 |
| journal | Applied Physics Letters |
| Volume | 71 |
| Numéro de publication | 13 |
| Les DOIs | |
| état | Publié - 29 sept. 1997 |
| Modification externe | Oui |
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