On the electrical activity of the (1̄11)-(1̄12) steps in the silico Σ = 3 twin boundary

J. L. Maurice

On the electrical activity of the (1̄11)-(1̄12) steps in the silico Σ = 3 twin boundary

J. L. Maurice

Résultats de recherche: Contribution à un journal › Article de conférence › Revue par des pairs

Résumé

Electron beam induced current (EBIC) measurements, using the scanning electron microscope, have been performed on a Σ = 3 twin boundary with (1̄11) - (11̄2) steps in silicon. The two interface planes, together with the two different dislocations at their intersections, frequently show no detectable electrical activity. Such an activity however appears when the step density is high. In this case, transmission electron microscopy (TEM) shows that a large proportion of the step dislocations is decorated by nano-precipitates.

langue originale	Anglais
Pages (de - à)	581-586
Nombre de pages	6
journal	Journal de physique. Colloque
Volume	C1
Numéro de publication	1
état	Publié - 1 janv. 1990
Evénement	Proceedings of the International Congress 1989: Intergranular and Interphase Boundaries in Materials - Paris, Fr Durée: 4 sept. 1989 → 8 sept. 1989

Contient cette citation

@article{286be2fed2394d209cd7b0be43d90f74,

title = "On the electrical activity of the ({\=1}11)-({\=1}12) steps in the silico Σ = 3 twin boundary",

abstract = "Electron beam induced current (EBIC) measurements, using the scanning electron microscope, have been performed on a Σ = 3 twin boundary with ({\=1}11) - (1{\=1}2) steps in silicon. The two interface planes, together with the two different dislocations at their intersections, frequently show no detectable electrical activity. Such an activity however appears when the step density is high. In this case, transmission electron microscopy (TEM) shows that a large proportion of the step dislocations is decorated by nano-precipitates.",

author = "Maurice, \{J. L.\}",

year = "1990",

month = jan,

day = "1",

language = "English",

volume = "C1",

pages = "581--586",

journal = "Journal de physique. Colloque",

issn = "0449-1947",

number = "1",

note = "Proceedings of the International Congress 1989: Intergranular and Interphase Boundaries in Materials ; Conference date: 04-09-1989 Through 08-09-1989",

}

TY - JOUR

T1 - On the electrical activity of the (1̄11)-(1̄12) steps in the silico Σ = 3 twin boundary

AU - Maurice, J. L.

PY - 1990/1/1

Y1 - 1990/1/1

N2 - Electron beam induced current (EBIC) measurements, using the scanning electron microscope, have been performed on a Σ = 3 twin boundary with (1̄11) - (11̄2) steps in silicon. The two interface planes, together with the two different dislocations at their intersections, frequently show no detectable electrical activity. Such an activity however appears when the step density is high. In this case, transmission electron microscopy (TEM) shows that a large proportion of the step dislocations is decorated by nano-precipitates.

AB - Electron beam induced current (EBIC) measurements, using the scanning electron microscope, have been performed on a Σ = 3 twin boundary with (1̄11) - (11̄2) steps in silicon. The two interface planes, together with the two different dislocations at their intersections, frequently show no detectable electrical activity. Such an activity however appears when the step density is high. In this case, transmission electron microscopy (TEM) shows that a large proportion of the step dislocations is decorated by nano-precipitates.

M3 - Conference article

AN - SCOPUS:0025238206

SN - 0449-1947

VL - C1

SP - 581

EP - 586

JO - Journal de physique. Colloque

JF - Journal de physique. Colloque

IS - 1

T2 - Proceedings of the International Congress 1989: Intergranular and Interphase Boundaries in Materials

Y2 - 4 September 1989 through 8 September 1989

ER -

On the electrical activity of the (1̄11)-(1̄12) steps in the silico Σ = 3 twin boundary

Résumé

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