One-step electrodeposited CuInSe2 thin films studied by Raman spectroscopy

O. Ramdani; J. F. Guillemoles; D. Lincot; P. P. Grand; E. Chassaing; O. Kerrec; E. Rzepka

doi:10.1016/j.tsf.2007.02.109

One-step electrodeposited CuInSe₂ thin films studied by Raman spectroscopy

O. Ramdani
, J. F. Guillemoles
, D. Lincot
, P. P. Grand
, E. Chassaing
, O. Kerrec
, E. Rzepka

CNRS
Université Versailles-Saint Quentin

Résultats de recherche: Contribution à un journal › Article › Revue par des pairs

Résumé

CuInSe₂ thin films one-step electrodeposited under different conditions were studied by MicroRaman spectroscopy to identify and quantify the individual phases present in the films. From the analysis of the Raman spectra, the main ternary phase (CuInSe₂) and elementary selenium Se⁰ were clearly identified. Specific chemical etches confirm the presence of elementary selenium Se⁰ and copper selenide binary phases Cu_xSe in selenium rich film. The amounts of these two phases were evaluated from X-ray Fluorescence measurements and confirmed using phase selective chemical treatments.

langue originale	Anglais
Pages (de - à)	5909-5912
Nombre de pages	4
journal	Thin Solid Films
Volume	515
Numéro de publication	15 SPEC. ISS.
Les DOIs	https://doi.org/10.1016/j.tsf.2007.02.109
état	Publié - 31 mai 2007

Accès au document

10.1016/j.tsf.2007.02.109

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@article{176321f1aaaa4b13a4a1c20a669b093f,

title = "One-step electrodeposited CuInSe2 thin films studied by Raman spectroscopy",

abstract = "CuInSe2 thin films one-step electrodeposited under different conditions were studied by MicroRaman spectroscopy to identify and quantify the individual phases present in the films. From the analysis of the Raman spectra, the main ternary phase (CuInSe2) and elementary selenium Se0 were clearly identified. Specific chemical etches confirm the presence of elementary selenium Se0 and copper selenide binary phases CuxSe in selenium rich film. The amounts of these two phases were evaluated from X-ray Fluorescence measurements and confirmed using phase selective chemical treatments.",

keywords = "Chemical etch, CuInSe, CuSe, Electrodeposition, Elementary selenium, Raman spectroscopy",

author = "O. Ramdani and Guillemoles, \{J. F.\} and D. Lincot and Grand, \{P. P.\} and E. Chassaing and O. Kerrec and E. Rzepka",

year = "2007",

month = may,

day = "31",

doi = "10.1016/j.tsf.2007.02.109",

language = "English",

volume = "515",

pages = "5909--5912",

journal = "Thin Solid Films",

issn = "0040-6090",

number = "15 SPEC. ISS.",

}

TY - JOUR

T1 - One-step electrodeposited CuInSe2 thin films studied by Raman spectroscopy

AU - Ramdani, O.

AU - Guillemoles, J. F.

AU - Lincot, D.

AU - Grand, P. P.

AU - Chassaing, E.

AU - Kerrec, O.

AU - Rzepka, E.

PY - 2007/5/31

Y1 - 2007/5/31

N2 - CuInSe2 thin films one-step electrodeposited under different conditions were studied by MicroRaman spectroscopy to identify and quantify the individual phases present in the films. From the analysis of the Raman spectra, the main ternary phase (CuInSe2) and elementary selenium Se0 were clearly identified. Specific chemical etches confirm the presence of elementary selenium Se0 and copper selenide binary phases CuxSe in selenium rich film. The amounts of these two phases were evaluated from X-ray Fluorescence measurements and confirmed using phase selective chemical treatments.

AB - CuInSe2 thin films one-step electrodeposited under different conditions were studied by MicroRaman spectroscopy to identify and quantify the individual phases present in the films. From the analysis of the Raman spectra, the main ternary phase (CuInSe2) and elementary selenium Se0 were clearly identified. Specific chemical etches confirm the presence of elementary selenium Se0 and copper selenide binary phases CuxSe in selenium rich film. The amounts of these two phases were evaluated from X-ray Fluorescence measurements and confirmed using phase selective chemical treatments.

KW - Chemical etch

KW - CuInSe

KW - CuSe

KW - Electrodeposition

KW - Elementary selenium

KW - Raman spectroscopy

UR - https://www.scopus.com/pages/publications/34247364935

U2 - 10.1016/j.tsf.2007.02.109

DO - 10.1016/j.tsf.2007.02.109

M3 - Article

AN - SCOPUS:34247364935

SN - 0040-6090

VL - 515

SP - 5909

EP - 5912

JO - Thin Solid Films

JF - Thin Solid Films

IS - 15 SPEC. ISS.