TY - GEN
T1 - Patch-based SAR image classification
T2 - IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015
AU - Tabti, Sonia
AU - Deledalle, Charles Alban
AU - Denis, Loic
AU - Tupin, Florence
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/11/10
Y1 - 2015/11/10
N2 - Due to their coherent nature, SAR (Synthetic Aperture Radar) images are very different from optical satellite images and more difficult to interpret, especially because of speckle noise. Given the increasing amount of available SAR data, efficient image processing techniques are needed to ease the analysis. Classifying this type of images, i.e., selecting an adequate label for each pixel, is a challenging task. This paper describes a supervised classification method based on local features derived from a Gaussian mixture model (GMM) of the distribution of patches. First classification results are encouraging and suggest an interesting potential of the GMM model for SAR imaging.
AB - Due to their coherent nature, SAR (Synthetic Aperture Radar) images are very different from optical satellite images and more difficult to interpret, especially because of speckle noise. Given the increasing amount of available SAR data, efficient image processing techniques are needed to ease the analysis. Classifying this type of images, i.e., selecting an adequate label for each pixel, is a challenging task. This paper describes a supervised classification method based on local features derived from a Gaussian mixture model (GMM) of the distribution of patches. First classification results are encouraging and suggest an interesting potential of the GMM model for SAR imaging.
KW - GMM
KW - SAR images
KW - classification
KW - patches
UR - https://www.scopus.com/pages/publications/84962489633
U2 - 10.1109/IGARSS.2015.7326286
DO - 10.1109/IGARSS.2015.7326286
M3 - Conference contribution
AN - SCOPUS:84962489633
T3 - International Geoscience and Remote Sensing Symposium (IGARSS)
SP - 2374
EP - 2377
BT - 2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 26 July 2015 through 31 July 2015
ER -